Measurement circuits and methods for integrated circuit design

A technology for measuring circuits and measuring methods, which is applied in the direction of measuring electrical variables, measuring resistance/reactance/impedance, measuring devices, etc., can solve the problems of inability to accurately measure the resistance value of fuse resistance, and achieve the effect of accurately measuring the resistance value

Active Publication Date: 2018-03-23
SEMICON MFG INT (SHANGHAI) CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The main purpose of the present invention is to provide a kind of measurement circuit and method for integrated circuit design, to solve the problem that the resistance value of the fuse resistor of IP core level cannot be accurately measured in the prior art

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  • Measurement circuits and methods for integrated circuit design
  • Measurement circuits and methods for integrated circuit design
  • Measurement circuits and methods for integrated circuit design

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Embodiment Construction

[0023] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0024] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0025] An embodiment of the present invention...

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Abstract

The invention discloses a measuring circuit and method for integrated circuit design. Wherein, the measurement circuit for integrated circuit design includes: a fuse; a first measurement circuit, connected to the fuse, includes a first measurement terminal, and the first measurement terminal is used to provide the first measurement circuit with Applying a voltage to measure the resistance value of the first measurement circuit; and a second measurement circuit, the second measurement circuit having the same resistance value as the first measurement circuit, including a second measurement terminal, the second measurement terminal It is used for applying voltage to the second measuring circuit to measure the resistance value of the second measuring circuit. The present invention solves the problem in the prior art that the resistance value of the fuse at the IP core level cannot be accurately measured, and further achieves the effect of accurately measuring the resistance value of the fuse at the IP core level.

Description

technical field [0001] The invention relates to the field of integrated circuit design, in particular to a measurement circuit and method for integrated circuit design. Background technique [0002] With the gradual maturity of the theory and technology of fuses, the application range of fuses has expanded rapidly. The resistance value of the fuse before and after burning is a key indicator of the integrated circuit design of the entire fuse module. The fuse unit usually used in the prior art is sequentially obtained from the power supply to the ground by PMOS, fuse and NMOS in series. For such a structure, it is difficult to measure its resistance value, because the voltage of the measurement point is directly connected across the PMOS The gate and source terminals of the current increase with the voltage of the measurement point at a quadratic rate, which is not easy to control. If the current is too small, the PMOS is not opened enough, and the measurement accuracy is t...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/08
Inventor 陈先敏杨家奇
Owner SEMICON MFG INT (SHANGHAI) CORP
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