A test system and test method for direct injection into controllable pulse source partial discharge instrument
A test system and pulse source technology, applied in the direction of instruments, measuring devices, measuring electrical variables, etc., can solve the problems that the performance and reliability cannot meet the partial discharge test requirements, there is no means and system of instrument test, and the pulse parameters can be achieved. Adjustment, stable output pulse, strong anti-interference effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0017] The implementation examples will be described in detail below in conjunction with the accompanying drawings. It should be emphasized that the following descriptions are only illustrative, not intended to limit the scope of the present invention and its application.
[0018] figure 1 It is a structural block diagram of the test system directly injected into the controllable pulse source partial discharge instrument. Such as figure 1 As shown, the test system for directly injecting the controllable pulse source partial discharge instrument provided by the present invention includes a controllable pulse source 1, a shielded antenna 2, a partial discharge instrument 3 to be tested, a digital oscilloscope 4, a wire 5, a protective ground 6, a zero position Grounding 7; controllable pulse source 1, shielded antenna 2, partial discharge instrument to be tested 3, digital oscilloscope 4, protective ground 6, zero ground 7, connected end to end through wire 5 in turn; controlla...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



