System and method for analysing, by laser induced plasma spectroscopy, the composition of a surface layer and for taking samples with a view to performing complementary analyses

A plasma and laser-induced breakdown technology, applied in the system field, can solve problems such as inability to inspect contamination, inability to analyze surface contamination, etc.

Active Publication Date: 2015-11-18
欧安诺核退役公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0011] None of the techniques disclosed in these documents can analyze the surface contamination of the material, nor can it be sampled to check for this contamination, or to perform additional qualitative or quantitative analysis.

Method used

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  • System and method for analysing, by laser induced plasma spectroscopy, the composition of a surface layer and for taking samples with a view to performing complementary analyses
  • System and method for analysing, by laser induced plasma spectroscopy, the composition of a surface layer and for taking samples with a view to performing complementary analyses

Examples

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Embodiment Construction

[0057] figure 1 A first example of the invention is schematically shown, in which application a material is inspected for surface radioactive contamination.

[0058] Thus, the system is not only capable of analyzing but also inspecting the surface contamination 2 of the material 4 . This analysis uses LIBS technology. In the described example, the system is portable. Surface contamination of this material is radioactive in nature.

[0059] figure 1 Systems for the analysis and inspection of radioactive contamination represented in include:

[0060] a single pulse laser 6, such as a pulsed YAG laser, for causing the pulsed laser beam to interact with the surface contamination 2 and generate a plasma 8 at the surface of the material 4; and,

[0061] Device for focusing the pulsed laser beam onto the surface of the material 4 .

[0062] The device comprises an optical fiber 10 optically coupled to a laser 6 at one end. The other end of the optical fiber 10 is fitted with a...

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Abstract

Analysing the composition of the surface layer of a material by laser-induced breakdown spectroscopy (LIBS) using a single pulsed laser 6, to generate a pulsed laser beam that interacts with the surface layer of the material 4 to produce a plasma 8 on the surface of the material. A device 10, 12 focuses the laser beam on the surface of the material and another device 18, 20 collects the light emitted by the plasma; this is then spectrally analysed by a device 22 to determine the elemental composition of the surface. A further device 30, 32, 34 sucks up and collects particles ablated from the surface layer for at least one additional qualitative or quantitative analysis. The light may be transmitted to the material and collected by optical fibres 10, 18 fitted with lenses 12, 20 and the suction device may be a cyclone 30 and pump 32 which collects particles on a filter 36. The additional analysis may be to examine for radiological contamination.

Description

technical field [0001] The present invention relates to a system, which can analyze the composition of the material surface layer through LIBS (laser-induced breakdown spectroscopy, laser-induced breakdown spectroscopy), and can sample the representative particles of the surface layer, so that the surface layer Perform additional qualitative or quantitative analysis, or conduct inspections. [0002] More specifically, the present invention relates to a system capable of analyzing surface contamination of materials by LIBS and capable of inspecting the contamination. [0003] The system is intended specifically for the analysis and inspection of surface chemical contamination of materials, but more specifically for the analysis and inspection of surface radioactive contamination of materials, especially for radiological monitoring of workshops, buildings and, more generally, nuclear installations. The purpose of the study is specifically to map their radioactive status before ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/71G01N1/22G01N1/04
CPCG01N21/718G01N2001/045G01N2201/0221
Inventor 伯纳德·皮科蒂埃里·瓦伦特
Owner 欧安诺核退役公司
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