A capsule head defect detection method
A defect detection and capsule technology, applied in the direction of optical defect/defect test, image analysis, instrument, etc., can solve the problems of high cost and low efficiency, and achieve the effect of improving accuracy
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[0032] In order to make the objects and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0033] Such as Figure 1-6 As shown, the embodiment of the present invention provides a capsule head defect detection method, including the following steps:
[0034] S1, select a threshold, and binarize the RGB color image of the capsule head to obtain a binarized image;
[0035] S2. Determine and intercept the spot area;
[0036] S3. To extract the boundary of the binary image of the capsule head, various edge detection methods such as Sobel and Robert can be used;
[0037] S4, ellipse fitting binarized image boundary;
[0038] S41. Accumulate the number of pixels of each extracted boundary;
[0039] S42, keep the two longest boundaries, a...
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