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Memory service life test algorithm

A life test and memory technology, applied in the field of memory, can solve the problems of no memory erasing and writing life test, uncertain memory life, inability to provide reliable and effective basis for meter storage algorithm and power meter data reliability test, etc. Accurate memory life, accurate and reliable algorithms, and cost-saving effects

Active Publication Date: 2015-11-25
NINGBO SANXING INTELLIGENT ELECTRIC +1
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  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the mass production of memory, there will be differences in the consistency of memory products, and the number of erasing and writing of memory in different batches will also be different. At present, the inspection of memory supplied in batches is only the inspection of electrical performance, and there is no test for memory erasure. The write life test makes the life of the memory uncertain, and cannot provide a reliable and effective basis for the meter storage algorithm and the data reliability test of the electric energy meter

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Embodiment Construction

[0020] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0021] Such as figure 1 , a memory life test algorithm, a calculator unit is added to the memory life test program, the upper limit of the rated life is set according to the data sheet of the memory, and then the limit life upper limit of at least 2 times the upper limit of the rated life is set, the steps are as follows:

[0022] Step a): The memory life test program detects the memory, and checks whether the number of reads and writes exceeds the upper limit of the limited life. If the number of reads and writes exceeds the upper limit of the limited life, it is determined that the memory is invalid and reaches the maximum life of erasing and writing; if the number of reads and writes does not exceed Limit life upper limit, then test the number of tests of the limit life upper limit and increase the number of tests by one, and then enter step...

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Abstract

The invention provides a memory service life test algorithm. A calculator unit is added into a memory service life test program; a rated service life upper limit is set according to a memory data manual; then, an ultimate service life upper limit being at least twice of the rated service life upper limit is set; if the number of read-write times is greater than the ultimate service life upper limit, the condition that a memory fails is judged; if the number of the read-write times does not exceed the ultimate service life upper limit, the total number of test times obtained through adding one test time number to the ultimate service life upper limit is tested; then, a storage region of the memory is continuously subjected to read-write operation; data, with the fixed lengths, written in each time is different; the total number of operation times, the total number of write-in error times and the total number of read error times are recorded; after the test on the total number of test times is completed, whether the number of read-write error times exceeds 60 percent of the total number of test times or not is judged; if so, the condition that the memory fails is judged; and if not, the condition that the memory does not fail is judged. The invention provides the reliable and powerful basis for mass cargo supply memory service life inspection, electric energy meter data reliability test and meter storage algorithms.

Description

technical field [0001] The invention relates to the field of memory, in particular to a memory life testing algorithm. Background technique [0002] Memory is a memory device used to store information in modern information technology. Its concept is very broad and has many levels. In digital systems, as long as it can store binary data, it can be a memory; The circuit with storage function is also called memory, such as RAM, FIFO, etc.; in the system, storage devices in physical form are also called memory, such as memory sticks and TF cards; all information in the computer, including input raw data, computer programs, intermediate Both the running result and the final running result are stored in the memory. It stores and retrieves information according to the location specified by the controller; with memory, the computer has a memory function to ensure normal operation; the memory in the computer can be divided into main memory and auxiliary memory according to the purpo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
Inventor 郑坚江许大帅郜波何涛
Owner NINGBO SANXING INTELLIGENT ELECTRIC
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