A memory life test method

Abstract

A memory life test algorithm, adding a calculator unit to the memory life test program, setting the upper limit of the rated life according to the data sheet of the memory, and then setting the upper limit of the life of at least 2 times the upper limit of the rated life; if the number of reads and writes is greater than the upper limit of the life, Then it is determined that the memory is invalid; if the number of reads and writes does not exceed the limit life limit, then the limit life limit plus the total number of tests of the test times are tested, and then the storage area of ​​the memory is continuously read and written, and the fixed-length data written each time They are all different, and record the total number of operations, the total number of write errors, and the total number of read errors. After the test is completed, determine whether the number of read and write errors exceeds 60% of the total number of tests. failure; if not exceeded, it is judged that the memory is not invalid; the invention provides a reliable and powerful basis for the inspection of the life of the memory supplied in batches, the data reliability test of the electric energy meter and the meter storage algorithm.

Description

technical field [0001] The invention relates to the field of memory, in particular to a memory life testing method. Background technique [0002] Memory is a memory device used to store information in modern information technology. Its concept is very broad and has many levels. In digital systems, as long as it can store binary data, it can be a memory; The circuit with storage function is also called memory, such as RAM, FIFO, etc.; in the system, storage devices in physical form are also called memory, such as memory sticks and TF cards; all information in the computer, including input raw data, computer programs, intermediate Both the running result and the final running result are stored in the memory. It stores and retrieves information according to the location specified by the controller; with memory, the computer has a memory function to ensure normal operation; the memory in the computer can be divided into main memory and auxiliary memory according to the purpose,...

AI Technical Summary

Problems solved by technology

[0004] In the mass production of memory, there will be differences in the consistency of memory products, and the number of erasing and writing of memory in different batches will also be different. At present, the inspection of memory supplied in batches is only the inspection of electrical performance, and there is no test for memory erasure. The write life test makes the life of the memory uncertain, and cannot provide a reliable and effective basis for the meter storage method and the data reliability test of the electric energy meter

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