Laser differential confocal LIBS, Raman spectrum-mass spectrum imaging method and Raman spectrum-mass spectrum imaging device

A differential confocal and Raman spectroscopy technology, applied in measurement devices, Raman scattering, material excitation analysis, etc., can solve problems such as drift, low spatial resolution of mass spectrometry detection, and restricting the accurate and complete acquisition of sample component information. , to achieve the effect of compressing size and improving spatial resolution

Inactive Publication Date: 2015-12-09
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] 1) Due to the use of simple laser focusing to desorb and ionize the sample, there are still problems such as large laser focusing spot and low spatial resolution of mass spectrometry detection;
[0006] 2) It is impossible to detect neutral atoms, molecules, neutral ions and groups, etc., which restricts the accurate and complete acquisition of sample component information;
[0007] 3) The time required for mass spectrometry imaging is long, and the axial position of the focused spot of the laser mass spectrometer often drifts relative to the sample to be measured

Method used

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  • Laser differential confocal LIBS, Raman spectrum-mass spectrum imaging method and Raman spectrum-mass spectrum imaging device
  • Laser differential confocal LIBS, Raman spectrum-mass spectrum imaging method and Raman spectrum-mass spectrum imaging device
  • Laser differential confocal LIBS, Raman spectrum-mass spectrum imaging method and Raman spectrum-mass spectrum imaging device

Examples

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Embodiment 1

[0053] The embodiment of the present invention is based on Figure 4 The shown high spatial resolution laser differential confocal spectrum-mass spectrometer imaging device includes a laser point light source system 24, a collimator lens 25 placed along the optical axis, an outgoing beam attenuator 38, a ring light generation system 3, and a beam splitter The mirror 5, the center hole beam splitter 6 and the center hole measurement objective lens 7 which is located in the refraction direction of the optical axis and focuses the light beam reflected by the center hole color splitter 6 to the measured sample 8, including the focused light spot reflection light of the center hole measurement objective lens 7 The intensity signal is a differential confocal light intensity detection system composed of a dichroic beam splitter 40, a detection beam attenuator 39, and a differential confocal light intensity detector 2, which is used to detect the Raman spectrum 43 excited by the focuse...

Embodiment 2

[0076] like Figure 5 As shown, in the high spatial resolution laser differential confocal induced breakdown and Raman spectrum-mass spectrometer imaging device of embodiment 1, the ring light generation system 3 can be generated by a vector beam placed along the optical axis to generate a vector beam The system 21 and the pupil filter 22 are replaced to generate an annular light beam 23 , which is reflected by the center hole color separator 6 and focused by the center hole measurement objective lens 7 to irradiate the measured sample 8 with a tiny spot exceeding the diffraction limit.

[0077] The remaining imaging measurement methods are the same as in Example 1.

Embodiment 3

[0079] like Figure 5 As shown, in the high spatial resolution laser differential confocal induced breakdown and Raman spectrum-mass spectrometer imaging device of Embodiment 1, the computer 10 can control the two-dimensional scanning galvanometer system 37 to align the middle hole measurement objective lens 7 The next area to be tested of the sample 8 to be tested.

[0080] The remaining imaging measurement methods are the same as in Example 1.

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Abstract

The invention relates to a laser differential confocal LIBS, a Raman spectrum-mass spectrum imaging method and a Raman spectrum-mass spectrum imaging device and belongs to the technical fields of confocal microscopy imaging, mass spectrum imaging and spectral measurement. In the invention, the differential confocal microscopy imaging technology is combined with a spectrum and mass spectrum detection technology; a high-spatial-discrimination differential confocal system is used for axially focusing and imaging a sample; a mass spectrum detection system is used for performing mass spectrum detection to charged molecules and atoms in a sample microcell; and a spectral detection system is used for performing microcell spectrum detection to focal spot excitation spectrums (Raman spectrum and induced breakdown spectrum) of a differential confocal microscopy system, thereby achieving high-spatial discrimination and high-sensitivity imaging and detection of complete component information and configuration parameters of the sample microcell. The invention achieves advantage complement and structure and function fusion of laser poly-spectrum component imaging detection (mass spectrum, Raman spectrum and laser-induced breakdown spectrum). The method and the device have wide application prospect in the fields of biology, physical chemistry, micro-fabrication and nano-fabrication and the like.

Description

technical field [0001] The invention belongs to the field of differential confocal microscopic imaging technology, spectral imaging technology and mass spectrometric imaging technology, and combines laser differential confocal microscopic imaging technology, laser induced breakdown spectral imaging technology, Raman spectral imaging technology and mass spectrometric imaging technology, and relates to a A high-spatial-resolution laser differential confocal-induced breakdown, Raman spectroscopy-mass spectroscopy microscopic imaging method and device have broad application prospects in the fields of biology, materials, minerals, and micro-nano manufacturing. technical background [0002] Mass spectrometry (Mass Spectrometry) is to ionize the components in the sample, so that the generated charged atoms, molecules or molecular fragments with different charge-to-mass ratios are respectively focused under the action of electric field and magnetic field to obtain a spectrum arranged...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63G01N21/65G01N27/64
Inventor 赵维谦邱丽荣王允
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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