Optical cable surface defect detecting system based on planar array CMOS cameras
A defect detection, area array technology, applied in the direction of optical testing flaws/defects, etc., can solve the problems of increasing system complexity and cost, long image acquisition time, waste of detection cost, etc., to improve production efficiency and product quality, reduce The effect of high manufacturing cost and rejection rate, detection rate and efficiency
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[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0028] Such as Figure 1 to Figure 2 Shown, for a kind of optical cable surface defect detection system based on area array CMOS camera of the present invention, comprising:
[0029] One or more area-array CMOS cameras 1 are installed on the system bracket 2, and are used to take real-time 360-degree photos of the surface of the optical cable 3 to be inspected, and send them to the analysis and detection module. The photos include information on the length and...
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