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Control apparatus, robot, and control method

一种控制装置、图案的技术，应用在测量装置、采用光学装置、仪器等方向，能够解决无法三维测量等问题

Active Publication Date: 2015-12-23
SEIKO EPSON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] However, conventional devices cannot perform three-dimensional measurement based on pattern images corresponding to the material, shape, etc. of the object to be measured for three-dimensional measurement

Method used

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  • Control apparatus, robot, and control method
  • Control apparatus, robot, and control method
  • Control apparatus, robot, and control method

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Embodiment approach

[0060] Hereinafter, embodiments of the present invention will be described with reference to the drawings. figure 1 It is a block diagram showing an example of the control system 1 of this embodiment. The control system 1 includes an imaging unit 10 , a projection unit 20 , and a control device 30 . In addition, the imaging unit 10 includes a first imaging unit 11 and a second imaging unit 12, and performs stereo imaging. In addition, the imaging unit 10 may be configured to include three or more imaging units. Hereinafter, for convenience of description, when there is no need to distinguish the first imaging unit 11 and the second imaging unit 12 , they will be collectively referred to as the imaging unit 10 for description. In the following, when the first imaging unit 11 and the second imaging unit 12 are collectively referred to as the imaging unit 10 , it will be described as the first imaging unit 11 and the second imaging unit 12 performing the same processing. The t...

example 2

[0143] Hereinafter, Modification 2 of the embodiment of the present invention will be described with reference to the drawings. The control unit 36 ​​of the control system 1 according to Modification 2 of the embodiment is Figure 22 In the process of step S250 of the shown flowchart, the variance of the distribution of the variance of the normalized luminance values ​​calculated for each of the windows in the grid pattern captured image of the image set selected in step S240 is calculated. Furthermore, the determination unit 45 selects the dot size of the random dot pattern image based on the variance of the distribution of the variance described above.

[0144] Below, refer to Figure 24 , the pattern image selection process performed by the control device 30 according to Modification 2 of the embodiment will be described. Figure 24 It is a flowchart showing an example of the flow of pattern image selection processing performed by the control device 30 according to Modifi...

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Abstract

A control apparatus includes a projection unit configured to project a first pattern onto an object; and a selection unit configured to select a single first pattern from a plurality of first patterns. After the projection unit projects each of the plurality of first patterns having different resolutions onto the object, the projection unit projects a second pattern onto the object, the second pattern having the same resolution as that of the selected single first pattern.

Description

technical field [0001] The invention relates to a control device, a robot and a control method. Background technique [0002] Technology is being researched and developed for imaging a measurement object on which a pattern image is projected by a projection unit, and performing various processing based on 3D measurement of the measurement object (for example, generation of a 3D point group, etc.) based on the captured image. [0003] In connection with this, there is known a three-dimensional measuring device for appropriately determining the boundary position between a bright portion and a dark portion in a case where reflected light is blurred in a spatial encoding method (see Patent Document 1). [0004] More specifically, in this three-dimensional measuring device, a projector projects a plurality of fringe pattern lights with different widths of alternately existing bright and dark regions on a subject, and a camera monitors the light from the subject projected with the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/2545G06T7/593G06T2207/10012H04N13/275G06T2207/10028G06T2207/20021G06T7/62
Inventor 原田智纪桥本浩一荒井翔悟房州俊树
Owner SEIKO EPSON CORP