Dynamic Particle Image Particle Size Particle Shape Analyzer and Method with Scanning and Stitching

An image particle size and image analysis technology, applied in particle size analysis, particle and sedimentation analysis, analysis of materials, etc., can solve the problems of no real-time focusing function, low precision, poor image clarity, etc., achieve real-time automatic focusing, improve measurement Accuracy, the effect of improving representativeness
CN105181538BActive Publication Date: 2018-06-26深圳市百利特科技有限公司
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
深圳市百利特科技有限公司
Publication Date
2018-06-26

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Abstract

The invention relates to a granularity and particle form analyzer and with scanning and splicing functions for a dynamic particle image and a method. An X-axis moving mechanism and a Y-axis moving mechanism are respectively mounted on a microscope stage transversely and longitudinally; a Z-axis moving mechanism is mounted on a microscope stand; a CCD camera is mounted at a third eye position of a microscope, and the data wire of the CCD camera is connected to a computer. The method comprises the following steps: controlling the microscope stage by the computer to move in three directions, namely X direction, Y direction and Z direction, and judging the definition of the image in real time; splicing the image to form a panoramic image for analysis, and realizing particle image analysis; controlling the X axis and the Y axis of the platform by the computer to move to realize multi-thread analysis of a picture, and thus carrying out independent and quick analysis on the panoramic image. According to the granularity and particle form analyzer and the method, the shortcomings caused by a manual microscope are overcome, the measurement precision is improved, the image definition is improved, the problem that the analysis site range is limited is solved, real-time automatic focusing of the image is realized, and the image is the most clearest all the time.
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Description

technical field

[0001] The invention relates to a dynamic particle image particle size analysis technology, in particular to a dynamic particle image particle size particle shape analyzer and method with scanning and splicing. Background technique

[0002] In the past, microscopic image particle size and particle shape analyzers were all under traditional microscopes. It was necessary to manually move the microscopic platform to capture particle image information, which was very cumbersome, and the interference of human factors had a great impact on the accuracy of measurement results. The field of view of the microscope objective lens is limited, and it is impossible to analyze large particles that exceed the range of the field of view after magnification, which affects the measurement dynamic range of the instrument under the single objective lens multiple. For example, if the 20x objective lens does not have the scanning stitching function, the analyzed particle size rang...

Claims

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