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Monitoring system and method

A technology for controlling signals and moving directions, applied in the field of electronics, can solve problems such as chip breakage and inability to detect, and achieve the effect of reducing the probability of fragmentation

Active Publication Date: 2015-12-30
FOUNDER MICROELECTRONICS INT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present application provides a monitoring system and method to solve the technical problem that the existing film mounter cannot detect whether the film is broken and the chip is broken

Method used

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Embodiment Construction

[0028] In order to make the purpose, technical solution and advantages of the invention of the application clearer, the technical solution of the application will be described in detail below in conjunction with the accompanying drawings and specific implementation methods. It should be understood that the embodiments of the application and the specific features in the embodiments are It is a detailed description of the technical solution of the present application, rather than a limitation of the technical solution of the present application. In the case of no conflict, the embodiments of the present application and the technical features in the embodiments can be combined with each other.

[0029] It should be noted here that the term "and / or" appearing in this article is only an association relationship describing associated objects, which means that there can be three relationships, for example, A and / or B can mean: A exists alone, There are three situations where A and B e...

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Abstract

The application discloses a monitoring system and a method. The system comprises a first detection device, a second detection device, and a control unit, the first detection device is arranged on a film-drawing device of a laminator and a place which the film-drawing device passes through in the moving direction and used for detecting and obtaining a first optocoupling signal for representing the film-drawing starting position of the film-drawing device and a second optocoupling signal for representing the final position of the film-drawing device, the second detection device is used for detecting and obtaining a first detection signal for representing the film-drawing process of the film-drawing device from the starting position to the final position, and the control unit is connected with the first detection device and the second detection device and used for receiving the first optocoupling signal and / or the second optocoupling signal, and the first detection signal and generating and outputting a first control signal based on the first optocoupling signal and / or the second optocoupling signal, and the first detection signal so that the laminator is controlled to be in the stopping state.

Description

technical field [0001] The present application relates to the field of electronic technology, in particular to a monitoring system and method. Background technique [0002] With the wide application of semiconductors, manufacturers produce a large number of various semiconductor devices. In the production process of semiconductor devices, it is necessary to attach films to wafers. Therefore, various types of film attachers have also appeared. The film mounter sticks various blue films or UV films on the surface of the wafer to protect the wafer during production. [0003] At present, since there are many types of film laminating machines, and the types of films are also different, the same film laminating machine may not be suitable for every kind of film. For example, when the ATM-1000C film laminating machine is pasting the blue film of Mitsui Chemicals SB-085L-BN20-R2, it is very easy to break the film at the waste film end, although Countermeasures can be taken to adju...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418
CPCY02P90/02
Inventor 谭汉军黄仁禄曹志兵
Owner FOUNDER MICROELECTRONICS INT
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