In-situ tensile sample for transmission electron microscope and preparation method of in-situ tensile sample

A technology of in-situ stretching and transmission electron microscopy, applied in the field of materials science, can solve problems such as low success rate and low technical efficiency, and achieve high success rate, wide application range and good stability
CN105223055AActive Publication Date: 2016-01-06INNER MONGOLIA UNIV OF TECH
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
INNER MONGOLIA UNIV OF TECH
Publication Date
2016-01-06

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Abstract

The invention discloses an in-situ tensile sample for a transmission electron microscope. The in-situ tensile sample comprises two standard substrates and a standard electron transmission sample body, wherein each standard substrate is a rectangular pop can sheet; a circular hole is formed in each pop can sheet; the standard electron transmission sample body is circular; a hole is formed in the center of the standard electron transmission sample body after the standard electron transmission sample body is subjected to twin-jet electropolishing; the standard electron transmission sample body is fixed on the two standard substrates symmetrically in a bridging manner.
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Description

technical field

[0001] The invention relates to the field of materials science, in particular, to the preparation of in-situ tensile samples in materials science. Background technique

[0002] Transmission Electron Microscopy (TEM) is a large-scale instrument for analyzing the structure and morphology of materials, and its theoretical resolution has reached 0.1nm. It is one of the most powerful tools for analyzing the structure of materials at the nanoscale. The in-situ tensile test of the sample in the transmission electron microscope can dynamically observe the initiation and propagation of micro-cracks, and the in-situ observation and recording of the deformation process between the grains of the micro-region of the material is very important for explaining the deformation process and fracture mechanism of the material. significance. Both ends of the in-situ stretching sample require a substrate capable of fixing the sample and conducting the loading force, and the middl...

Claims

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