Computer test system

A testing system and computer technology, applied in the direction of detecting faulty computer hardware, etc., can solve the problems of failure problems that cannot be dealt with in the first time, losses, and high costs for dealing with problems.

Inactive Publication Date: 2016-01-06
刘东亮
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] At present, when a product is put into use and there is a failure that can lead to a return, the handling method used is that the engineer in charge of the product flies to the location of the equipment to deal with it. First, because the failure cannot be dealt with in the first place, this method often misses the remedy This method has high requirements on people, and the engineers sent to the site must ensure that the fault problem can be solved, and the final method to deal with the problem is very expensive.
When random fatal failures occur during the product design process, the processing method used is to set up test platforms in large quantities, and special personnel to operate, simulate and monitor the resulting phenomena. Due to a certain lag in human operation, strict real-time and continuous testing cannot be achieved. Record

Method used

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  • Computer test system

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Embodiment Construction

[0008] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0009] figure 1 is a structural diagram of an embodiment of the present invention, such as figure 1 As shown, the computer test system of the present invention is electrically connected with the object to be debugged, and is used for storing data information memory 1, for controlling and processing the microcomputer control chip 2 for the acquired data information, and for connecting to the serial port debugging of the object to be debugged Module 3 and photoelectric indicating device 4 , the microcomputer control chip 2 is electrically connected to the memory 1 , and the microcomputer control chip 2 is electrically connected to the serial port debugging module 3 .

[0010] The microcomputer control chip 2 and the memory 1 are bidirectionally electrically connected to obtain the data information in the memory 1, and the microcomputer control chip 2 is...

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Abstract

The invention discloses a computer test system, which comprises a memory, a microcomputer control chip and a serial port debugging module used for connecting a debugged object. The computer test system can process a problem immediately when the problem happens, can continuously record data in real time and provides a reliable basis for judging fault problems.

Description

technical field [0001] The invention relates to a debugging device, in particular to a computer testing system. Background technique [0002] At present, when a product is put into use and there is a failure that can lead to a return, the handling method used is that the engineer in charge of the product flies to the location of the equipment to deal with it. First, because the failure cannot be dealt with in the first place, this method often misses the remedy This method has high requirements on people, and the engineers sent to the site must ensure that the fault problem can be solved, and the last method to deal with the problem is very expensive. When random fatal failures occur during the product design process, the processing method used is to set up test platforms in large quantities, and special personnel to operate, simulate and monitor the resulting phenomena. Due to a certain lag in human operation, strict real-time and continuous testing cannot be achieved. Rec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 刘东亮
Owner 刘东亮
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