A temperature-controlled test system for storage equipment

Abstract

The invention relates to a temperature-controlled test system for storage devices, comprising a temperature-controlled test chamber, at least one test control unit placed in the temperature-controlled test chamber, and used to generate A high-temperature or low-temperature refrigeration / heating device, a test chamber disposed adjacent to the temperature-controlled test chamber, and a test chamber placed in the test chamber for controlling the refrigeration / heating device and the test control unit test system. By adopting the technical solution of the present invention, by fixing the storage device test interface on the test control unit, and leading out the storage data interface through a cable on the back of the storage device test interface to directly insert it on the main board of the test host, the storage device The data signal does not need to be relayed by the test board, which makes the transmission of the stored data signal more stable, and greatly improves the reliability and standardization of the test.

Description

technical field [0001] The invention belongs to the field of control applications, in particular to a temperature-controlled test system for storage devices. Background technique [0002] In recent years, with the increasing maturity of technology, storage devices (solid-state drives, U disks, etc.) have been widely used in the consumer market, and have gradually penetrated into special fields such as industry and military from the consumer field. The market in these special fields puts forward higher requirements on high and low temperature environment adaptability, reliability, and power cycle of solid-state hard drives, which has also attracted the attention of solid-state hard drive manufacturers. Since the flash memory (flash) supply and manufacturing technology of solid-state hard drives are all controlled by a few foreign manufacturers, special-purpose, wide-temperature flash memory chips have problems such as difficulty in purchasing and restricted sales, making hard...

AI Technical Summary

Problems solved by technology

In this connection mode, the SATA signal of the computer mainboard passes through the test circuit board for signal transfer and then connects to the hard disk under test, which causes the data signal of the hard disk to attenuate, thereby affecting the reliability and standardization of the test.

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