Quality inspection monitoring apparatus, system and method

A monitoring device and quality inspection technology, applied in data processing applications, resources, calculations, etc., to achieve objective evaluation and improve the efficiency and accuracy of quality inspection

Inactive Publication Date: 2016-02-17
肖彦君
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a quality inspection monitoring device, system and method, which can monitor the geographical location, time, environment and working status of the quality inspector to avoid the quality inspection caused by it. inaccurate test results

Method used

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  • Quality inspection monitoring apparatus, system and method
  • Quality inspection monitoring apparatus, system and method
  • Quality inspection monitoring apparatus, system and method

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Embodiment Construction

[0014] Referring now to the accompanying drawings, in particular Figure 1 to Figure 4 , provides an exemplary diagram of a data processing environment in which illustrative embodiments of the invention may be implemented. should understand, Figure 1 to Figure 4 They are illustrative only, and are not intended to assert or imply any limitation with respect to the environments in which aspects or embodiments of the invention may be practiced. Many modifications may be made to the described environments without departing from the spirit and scope of the invention.

[0015] Referring now to the accompanying drawings, figure 1 A block diagram of a quality inspection monitoring device that may implement an exemplary embodiment is depicted. The quality inspection monitoring device 100 includes: a camera unit 101 , a sensing unit 102 , a clock unit 103 , a location unit 104 , and a control unit 105 .

[0016] The camera unit 101 is used to take photos or videos and generate imag...

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Abstract

The invention relates to a quality inspection monitoring apparatus, system and method. The quality inspection monitoring apparatus comprises a clock unit used for recording current time and generating time data, a position unit used for detecting a current geographic position and generating position data, a sensing unit used for sensing a working environment state and generating environmental data, a camera unit used for shooting photos or videos and generating image data or video data to record a working state of a quality inspector, and a control unit which is connected with the clock unit, the position unit, the sensing unit and the camera unit and is used for generating a quality inspection monitoring report based on various data received from the clock unit, the position unit, the sensing unit and the camera unit. The quality inspection monitoring apparatus, system and method can improve quality inspection efficiency and accuracy.

Description

technical field [0001] The invention belongs to the technical field of information monitoring, and in particular relates to a quality inspection monitoring device, system and method for monitoring quality inspection work and evaluating the working conditions of quality inspectors according to the monitoring results. Background technique [0002] The quality inspection of the project is mainly to ensure that the project is satisfactorily completed in accordance with the requirements specified by the designer. It includes enabling all functional activities of the entire project to be implemented in accordance with the original quality and target requirements. Quality management mainly depends on quality plans, quality It is realized by the quality assurance system formed by quality control, quality assurance and quality improvement. [0003] However, the existing quality inspection management is often designed and developed from the aspects of inspection equipment management, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06
Inventor 肖彦君
Owner 肖彦君
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