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Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems

A technology of automatic testing equipment and protocols, applied in the direction of measuring devices, instruments, measuring electronics, etc., can solve the problem of hardware consumption of critical time

Active Publication Date: 2016-03-02
ADVANTEST CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] Therefore, at the test site, replacing a hardware bus adapter card and manually reconfiguring the hardware consumes critical time when, for example, a DUT needs to test run on a different protocol than that supported by the existing adapter card

Method used

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  • Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems
  • Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems
  • Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems

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Embodiment Construction

[0038] Reference will now be made in detail to various embodiments of the invention, examples of which are illustrated in the accompanying drawings. While described in conjunction with these embodiments, it will be understood that they are not intended to limit the disclosure to these embodiments. On the contrary, the disclosure is intended to cover alternatives, modifications and equivalents, which may be included within the spirit and scope of the disclosure as defined by the appended claims. Furthermore, in the following detailed description of the present disclosure, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure. However, it is understood that the present disclosure may be practiced without these specific details. In other instances, well-known methods, procedures, components, and circuits have not been described in detail so as not to unnecessarily obscure aspects of the present disclosure.

[0039] Some p...

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Abstract

A method for performing tests using automated test equipment (ATE) is presented. The method comprises obtaining a protocol selection for programming a programmable tester module using a graphical user interface (GUI). It further comprises accessing a configuration file associated with a protocol from a remote computer through a network. Subsequently, it comprises configuring a programmable tester module with a communication protocol for application to at least one device under test (DUT) using the configuration file. Finally, it comprises transmitting instructions to the programmable tester module for executing a program flow, wherein the program flow comprises a sequence of tests for testing the at least one DUT, and receiving results for those tests from the programmable tester module.

Description

technical field [0001] The present disclosure relates generally to the field of automatic test equipment, and more particularly, to techniques for controlling such equipment. Background technique [0002] Automatic test equipment (ATE) may be any test assembly that performs tests on semiconductor wafers or dies, integrated circuits (ICs), circuit boards, or packaged devices such as solid state drives. ATE components can be used to perform automated tests that quickly perform measurements and generate test results that can then be analyzed. The ATE assembly can be anything from a computer system coupled to an instrumentation, a complex automated test assembly that can include a custom purpose-built computer control system and capable of automatically testing electronic parts and / or conducting semiconductor wafer testing (e.g. , System-on-Chip (SOC) testing or integrated circuit testing) many different test fixtures. ATE systems both reduce the amount of time it takes to tes...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/3183
CPCG01R31/318307
Inventor 杰拉德·陈艾瑞克·沃克里克
Owner ADVANTEST CORP
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