Method for testing resistor disc column parallel current distribution
A resistor chip column and current distribution technology, applied in the direction of measuring current/voltage, measuring device, measuring electrical variables, etc., can solve the problem that the current distribution cannot be measured at the same time as a whole, and achieve convenient operation, high test efficiency, and meet standards and products The effect of manufacturing requirements
Active Publication Date: 2016-03-23
CHINA XD ELECTRIC CO LTD
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Problems solved by technology
Due to the number of resistors connected in parallel to hundreds of columns and the capacity of the test equipment, the current distribution cannot be measured at the same time as a whole, and accurate measurement, simple measurement method, convenient operation and high efficiency are required in product manufacturing. Therefore, A new approach is needed to meet the above requirements
Method used
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Embodiment 1
[0030] The parallel connection number of resistance sheet columns is 48 columns, and the current distribution unevenness coefficient of parallel resistance sheet columns is not more than 1.05, and the process of passing the test of the present invention is:
[0031] 1) Randomly extract 8 resistor columns from the 48 column resistor columns to form the resistor column group to be tested;
[0032] 2) Under the 30 / 60μs operation impact waveform and 500±25A current, measure the current distribution of the resistor column group, select the resistor column with the largest current value and the resistor column with the smallest current value, and keep the resistor with the largest current value column and the resistor column with the smallest current value, supplement the unmeasured resistor column to form a new resistor column group to be tested, repeat the above steps, and obtain the maximum current value I measured last time max and the minimum current value I min , the measurem...
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Abstract
The invention discloses a method for testing resistor disc column parallel current distribution. The method comprises the steps of 1), distributing resistor discs to M resistor disc columns; 2), randomly selecting N resistor disc columns, and constructing a to-be-tested resistor disc column set; 3), under a preset impact current waveform and a preset impact current amplitude, respectively measuring the current which passes each resistor disc column in the to-be-tested resistor disc column set, and selecting the resistor disc column with highest measured current and the resistor disc column with lowest measured current; 4), selecting k resistor disc columns from the rest resistor disc columns, and forming a new to-be-tested resistor disc column set which is composed of the selected k resistor disc columns, the resistor disc column with the highest measured current and the resistor disc column with the lowest measured current obtained in the step 3); and repeating the step 3) and the step 4) until the M resistor disc columns are totally selected, obtaining the highest current and the lowest measured current which are measured in the last time, thereby obtaining the resistor disc column parallel current distribution. The method of the invention can be used for measuring the resistor disc column parallel current distribution.
Description
technical field [0001] The invention belongs to the field of overvoltage limiter testing, and relates to a testing method for parallel current distribution of resistance sheet columns. Background technique [0002] In the AC and DC power system, for the protective devices that limit overvoltage (such as arresters, voltage limiters, resistors, etc.), due to the requirements of protection level and energy absorption, multi-column resistors need to be connected in parallel to meet the requirements of the system. . For multi-column parallel resistor chip columns, the current distribution characteristics are very critical technical performance. In the standards of AC and DC arresters and series compensation devices (GB11032, GB / T22389, GB / T25083, GB / T6115.2, GB / T25309), the requirements for the uneven coefficient of current distribution of multi-column parallel resistors are specified. It is generally stipulated that the current distribution non-uniformity coefficient of multi-...
Claims
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Login to View More IPC IPC(8): G01R19/10
CPCG01R19/10
Inventor 何计谋谢清云祝嘉喜张宏涛
Owner CHINA XD ELECTRIC CO LTD