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Distance measurement method based on waveform matching in TOF technology

A technology of waveform matching and ranging method, which is used in radio wave measurement systems, radio wave reflection/re-radiation, measurement devices, etc., to achieve the effects of simple system design, reduced time complexity, and storage space savings

Inactive Publication Date: 2016-04-06
SHANGHAI JIAO TONG UNIV
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Problems solved by technology

However, when drawing a histogram with the discrete TOF cycle number as the abscissa and the number of times a certain TOF cycle number is obtained in repeated measurements as the ordinate, it can be found that the image does not have an absolute value like the normal distribution curve. High peak, but there are two peaks; this shows that there is a problem with the traditional idea of ​​determining a unique standard value in TOF ranging

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  • Distance measurement method based on waveform matching in TOF technology
  • Distance measurement method based on waveform matching in TOF technology
  • Distance measurement method based on waveform matching in TOF technology

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Embodiment Construction

[0035] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. This embodiment is carried out on the premise of the technical solution of the present invention, and detailed implementation and specific operation process are given, but the protection scope of the present invention is not limited to the following embodiments.

[0036] Such as figure 1 As shown, the ranging method based on waveform matching in the TOF technology provided by this embodiment is realized through the following steps:

[0037] In the first step, the general form of the waveform is obtained. Use TOF technology to carry out repeated measurements at different distances, draw multiple waveform diagrams with the number of TOF cycles as the abscissa, and the number of times a certain TOF cycle is collected in one measurement as the ordinate, and obtain different distances according to the drawn waveform diagrams The following waveform...

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Abstract

The invention relates to a distance measurement method based on waveform matching in the TOF technology. The method comprises steps that, A, the TOF technology is employed for repeated measurement, and multiple TOF period numbers are acquired; B, processing on the acquired TOF period numbers is carried out to acquire a measurement distance, specifically comprising B1), the TOF period numbers are taken as abscissas, frequency of a certain TOF period number during measurement is taken as an ordinate, and an oscillogram is acquired; B2), curve waveform parameter values and Boolean type parameter values of the oscillogram are acquired; B3), a pre-stored curve waveform parameter distance corresponding table is searched, prediction distances corresponding to the curve waveform parameter values in the B2) step are acquired, the optimal weight ratio is introduced, weight sum of all the prediction distances is carried out to acquire a preliminary measurement distance; and B4), error correction on the preliminary measurement distance is carried out according to the Boolean type parameter values of the B2) step, and the final measurement distance is acquired. Compared with the prior art, the method has advantages of high precision, storage space saving and low data processing complexity.

Description

technical field [0001] The invention relates to a method used in the field of wireless distance measurement, in particular to a method for analyzing distance measurement through waveform matching in TOF technology. Background technique [0002] TOF is the abbreviation of Time of Flight technology, which is widely used in the field of distance measurement. TOF is a two-way ranging technology, which mainly uses the flight time of the signal to and fro between two asynchronous transceivers to measure the distance between nodes. The time of flight is represented by the number of TOF cycles; the number of TOF cycles is the number of chip clock cycles from signal transmission to reception, also known as the TOF value. A measurement process includes two sub-processes of repeated TOF value collection and processing the collected data to obtain the measurement distance. The significance of repeated measurement is to reduce the impact of random errors on the measurement. However, t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S13/74
CPCG01S13/74
Inventor 巴若珉辛阔刘涛余明慧
Owner SHANGHAI JIAO TONG UNIV
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