Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An automatic debugging method for open-loop power linearity applied to signal generators

A signal generator and open-loop power technology, applied in transmission monitoring, electrical components, transmission systems, etc., can solve problems such as zero crossing, no fixed rules to follow, and affect the productivity of signal generators, etc., to achieve open-loop power Effect of Linearity Guarantee

Active Publication Date: 2018-10-12
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] (1) The debugging steps are complicated. Since the signal generator has a wide frequency range and many bands, it is first necessary to find the frequency corresponding to the intermediate power point in each band, and then repeatedly debug each parameter to determine whether the group of band parameters is correct. Meet the indicators
[0008] (2) The original debugging method can only debug the symmetry of the power frequency response curve and the power dynamic range of the debugging frequency point, but it cannot guarantee that the frequency response curve can cross the zero point. In addition, the best debugging points for the open-loop power linearity are not all available. Corresponding to the middle frequency point of each band, the current band open-loop power debugging effect may not be the best
[0009] (3) Due to the nonlinear characteristics of the circuit, the circuit parameters of each signal generator are different, and there is no fixed rule to follow, which greatly affects the debugging efficiency of the instrument
[0010] (4) When the debugging environment changes, the debugger needs to search for various test instruments for debugging, which will also affect the productivity of the signal generator

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An automatic debugging method for open-loop power linearity applied to signal generators
  • An automatic debugging method for open-loop power linearity applied to signal generators
  • An automatic debugging method for open-loop power linearity applied to signal generators

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0030] The automatic level loop control (ALC) system commonly used in modern signal generators is a feed-forward control method, and the premise of using this method is that the open-loop power of the ALC system must be accurate and controllable and adjustable , due to the wide frequency coverage and large power dynamic range of the component units and modules of the productized signal generator at this stage, the entire conditioning channel is composed of multi-sta...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

In order to improve the accuracy of the open-loop power linearity index and improve the ease of debugging and meet the requirements of instrument productivity, the present invention proposes an automatic debugging method for the open-loop power linearity, which can make the ALC open-loop power in Under the control of the internal debugging software, by reading the internal test voltage and the corresponding algorithm, the automatic open-loop power linearity debugging can be realized, which improves the open-loop power linearity index and debugging efficiency, and effectively reduces the production cost.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an automatic debugging method for open-loop power linearity. Background technique [0002] With the development of signal generation technology, the output power control has experienced from the open calibration power plus attenuation method to the closed-loop automatic level loop control method. At present, the feed-forward ALC system that can perform open-loop power control is widely used. , its principle block diagram is as follows figure 1 shown. [0003] With the increase of the frequency range and power dynamic range of the instrument, the cascaded amplifiers and multi-stage filters of microwave components are increasing, resulting in poor in-band frequency response in the full frequency range under open-loop conditions, and the extreme value of the frequency response band is often It will exceed the dynamic adjustment range of the ALC closed-loop adjustment, and can no l...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00
CPCH04B17/0085
Inventor 周俊杰刘盛时慧高训兵王鹏
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products