Method for evaluating risk of satellite deep charging
A deep charging and risky technology, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as over-evaluation and under-evaluation, and achieve the effect of avoiding time-consuming
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[0027] The method for assessing the risk of deep charging of satellites according to the present invention will be described in detail below with reference to the accompanying drawings and preferred embodiments.
[0028] Firstly, step 1: sampling the occlusion and parts to be evaluated inside the satellite into a flat structure or a coaxial structure, and obtaining the thickness value of the medium.
[0029] figure 1 Middle (a) and (b) are the dielectric structure models sampled by the evaluation method of the present invention, for example, all kinds of common cables in the satellite system can be sampled as figure 1 The coaxial model shown in (a), while the printed circuit board, etc. can be sampled as figure 1 The plate model shown in (b), figure 1 In (a), the medium 1 is surrounded on the inner core 2; figure 1 In (b), above the medium 4 is the shield 3 , and below it is the ground layer 5 .
[0030] As an example, in this embodiment, a printed circuit board medium in ...
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