An infrared small spot beam characteristic measuring device and measuring method
A technology for small infrared light spots and beam characteristics, applied in the field of testing, can solve problems such as the inability to meet the analysis of beam characteristics of small infrared light spots, and achieve the effect of simple operation and improved fitting accuracy.
Active Publication Date: 2018-08-14
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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[0004] In view of the fact that the current existing methods cannot satisfy the analysis of the characteristics of the infrared small light spot beam, the present invention proposes a measurement device and method for measuring the characteristics of the infrared small light spot beam, and uses the infrared imaging device scanning technology to realize the small spot diameter. accurate measurement
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[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0031] The current existing technology is aimed at the spot diameter of small infrared light spots that is much larger than the pixel size of infrared imaging devices. The size of the pixels is similar, and the spot after imaging only occupies 1 to 2 pixels. Obviously, direct infrared imaging cannot be used to test the beam characteristics. Therefore, the existing technology uses infrared imaging devices to illuminate the number of pixels and the size of the pi...
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The present invention proposes an infrared small light spot beam characteristic measurement device. The infrared imaging device is fixed on a precision three-dimensional electric control displacement stage, and the photosensitive surface of the infrared imaging device is adjusted to the focal plane of the small light spot through the three-dimensional displacement stage, and the control The displacement stage drives the infrared imaging device to scan relative to the small light spot, records the output voltage of a pixel that just crosses the small light spot, and draws the corresponding relationship curve between the signal output of this pixel and the scanning displacement, and calculates the infrared small light spot from the curve The diameter of the spot; scan in another vertical direction to obtain the spot diameter in the vertical direction; draw the spot quality graph of the small spot according to the scanning curves in the two directions. The invention adopts the infrared imaging device scanning method to realize accurate measurement of the spot diameter of the infrared small light spot; the fitting model of the infrared small light spot scanning curve adopts a mixed fitting model of quadratic and quaternary functions, which overcomes the common fitting method The defect of large deviations at the top or bottom of the curve improves the fitting accuracy.
Description
technical field [0001] The invention relates to the technical field of testing, in particular to a device for measuring the characteristics of an infrared small light spot beam, and also relates to a method for measuring the characteristic of an infrared small light spot beam. Background technique [0002] Infrared focal plane array crosstalk is generally tested by injecting infrared small light spots, and the size of the small light spots is required to be smaller than the size of the pixel. At present, the size of the infrared focal plane array pixel is mostly between 30 μm and 50 μm, so the small light spot used for the crosstalk test should be smaller than 50 μm. Usually, the F-number of infrared small-spot imaging optical system is relatively small, and its focal depth is very short, so the spot diameter obtained by slightly deviating from the focal plane position will have a large difference. If a unit infrared detector is used to detect small infrared light spots, it...
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IPC IPC(8): G01B11/08
CPCG01B11/08
Inventor 应承平王恒飞刘红元王洪超吴斌李国超姜斌霍明明张睿杨延召
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP