Three dimensional information vision measurement method based on refraction image deviation

A technology of three-dimensional information and measurement methods, applied in the direction of measuring devices, instruments, and optical devices, can solve the problems of cumbersome measurement process, low measurement efficiency, and limited measurement range, so as to improve measurement efficiency, increase measurement speed, and simplify measurement The effect of the process

Active Publication Date: 2016-05-11
DALIAN UNIV OF TECH
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Problems solved by technology

This measurement method cannot realize the construction of rectangles by arranging four feature points on the surface of any measured object, so the measurement range is very limited; secondly, in the process of constructing the characteristic rectangles, the geometric accuracy of the rectangles is difficult to guarantee, and the shape and size errors of the rectangles will affect the measurement results. have a large influence

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  • Three dimensional information vision measurement method based on refraction image deviation
  • Three dimensional information vision measurement method based on refraction image deviation
  • Three dimensional information vision measurement method based on refraction image deviation

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[0027] The specific embodiments of the present invention are described in detail below with reference to the technical solutions and the accompanying drawings. attached figure 1 It is a model diagram of a three-dimensional information visual measurement device based on refractive image deviation. The device uses a camera to take two pictures before and after the optical glass is blocked, so as to accurately measure the three-dimensional coordinates of space objects.

[0028] The installation method of the measuring device is as follows: a camera with a wide-angle lens is used to capture the image of the object. The camera model is FASTCAMUX50, the resolution: 1248*1024, and the frame rate: the maximum resolution can reach 2000fps when the resolution is 1024*1024. The wide-angle lens model is AF-S17-35mmf / 2.8DIF-ED The parameters are as follows, lens focal length: f=17-35, APS focal length: 25.5-52.5, maximum aperture: F2.8, minimum aperture: F22, lens weight: 745g , lens siz...

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Abstract

The invention provides a three dimensional information vision measurement method based on refraction image deviation, belonging to the technical field of computer vision measurement, and relates to a three dimensional information vision measurement method based on refraction image deviation. The measurement method comprises using a single camera to take a picture A1; putting a glass plate with a known refractive index at the front of the camera by any angles; and using the camera to take a picture A2, and completing measurement of the space three dimensional information of a measured object by means of the deviation value of the two pictures. The measurement method only needs one single camera to match with a parallel glass plate with the known thickness and can reconstruct the three dimensional information for the characteristics in the images with no requirement for assistance of laser and a projector and also having no demand for the priori knowledge in the known images, thus reducing the measurement cost and improving the measurement efficiency, and can realize quick measurement for the whole vision field for a monocular camera.

Description

technical field [0001] The invention belongs to the technical field of computer vision measurement, and relates to a three-dimensional information vision measurement method based on refraction image deviation. Background technique [0002] Visual measurement technology is widely used in various fields such as aviation, aerospace, military industry, navigation and navigation. Visual measurement has the advantages of non-contact and strong environmental adaptability, and the three-dimensional coordinates of space objects can be quickly measured through the pictures taken by the camera. However, the current monocular vision measurement often requires optical auxiliary equipment such as lasers and projectors to complete the measurement of spatial information, which leads to the disadvantages of cumbersome measurement process and low measurement efficiency. Invention patent CN105184857A applied by Li Xiuzhi and others from Beijing University of Technology, "Method for Determinin...

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Application Information

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IPC IPC(8): G01B11/24
CPCG01B11/24
Inventor 刘巍马鑫贾振元鲁继文李肖
Owner DALIAN UNIV OF TECH
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