Electronic device for dynamic simulation of open-circuit faults in DC high-voltage and high-current circuits

Abstract

The invention provides a DC high-voltage large-current circuit open-circuit fault dynamic simulation electronic device, which comprises a DC high-voltage relay and the like. The DC high-voltage relay and a clamp voltage bypass component are connected in parallel, and then, are connected in series in a direct-current circuit through a first connection end and a second connection end; the DC high-voltage relay is used for simulating open-circuit fault and normal connection states of a DC high-voltage large-current circuit; and the clamp voltage bypass component is used for providing short-time shunting for the DC high-voltage relay in the process of disconnecting the DC high-voltage relay to simulate the open-circuit fault, and automatically clamping the voltage drop of the input and output ends of the DC high-voltage relay within a range capable of preventing contact damage of the DC high-voltage relay so as to prevent damage to the DC high-voltage relay. The device can dynamically simulate the open-circuit fault of the DC high-voltage large-current circuit, and the simulation can be achieved losslessly, repeatedly and flexibly.

Description

technical field [0001] The invention relates to an electronic device, in particular to an electronic device for dynamically simulating an open-circuit fault of a DC high-voltage and large-current circuit. Background technique [0002] DC high-voltage and high-current circuits are widely used, such as electric vehicle drive motor power supply circuits and various power DC transmission circuits. If there is an open-circuit fault in the DC high-voltage and high-current circuit, it will not only affect the operation safety of the electrical equipment, but also cause damage to the electrical equipment due to the existence of various inductive loads and circuit distributed inductance in the circuit. Therefore, it is very important to study the performance of the power consumption system when the open-circuit fault of the DC high-voltage and high-current circuit occurs. The premise is to realize the dynamic simulation of open-circuit faults in DC high-voltage and high-current circ...

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Problems solved by technology

The premise is to realize the dynamic simulation of open-circuit faults in DC high-voltage and high-current circuits, but there is no similar research report so far.

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