Electronic device for dynamic simulation of open-circuit faults in DC high-voltage and high-current circuits

An open-circuit fault, DC high voltage technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., to achieve the effect of flexible simulation

Active Publication Date: 2019-08-23
SHANGHAI 01 POWER TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The premise is to realize the dynamic simulation of open-circuit faults in DC high-voltage and high-current circuits, but there is no similar research report so far.

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  • Electronic device for dynamic simulation of open-circuit faults in DC high-voltage and high-current circuits

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Embodiment Construction

[0014] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0015] like figure 1 As shown, the dynamic simulation electronic device of the present invention includes a high-voltage DC relay 1, a clamp bypass component 2, a control module 3, a first current sensor 4, and a second current sensor 5; wherein, the high-voltage DC relay 1 is connected in parallel with the clamping bypass component 2 and then connected in series in the DC circuit through its first connection terminal 6 and second connection terminal 7. The high-voltage DC relay 1 is used to simul...

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Abstract

The invention provides a DC high-voltage large-current circuit open-circuit fault dynamic simulation electronic device, which comprises a DC high-voltage relay and the like. The DC high-voltage relay and a clamp voltage bypass component are connected in parallel, and then, are connected in series in a direct-current circuit through a first connection end and a second connection end; the DC high-voltage relay is used for simulating open-circuit fault and normal connection states of a DC high-voltage large-current circuit; and the clamp voltage bypass component is used for providing short-time shunting for the DC high-voltage relay in the process of disconnecting the DC high-voltage relay to simulate the open-circuit fault, and automatically clamping the voltage drop of the input and output ends of the DC high-voltage relay within a range capable of preventing contact damage of the DC high-voltage relay so as to prevent damage to the DC high-voltage relay. The device can dynamically simulate the open-circuit fault of the DC high-voltage large-current circuit, and the simulation can be achieved losslessly, repeatedly and flexibly.

Description

technical field [0001] The invention relates to an electronic device, in particular to an electronic device for dynamically simulating an open-circuit fault of a DC high-voltage and large-current circuit. Background technique [0002] DC high-voltage and high-current circuits are widely used, such as electric vehicle drive motor power supply circuits and various power DC transmission circuits. If there is an open-circuit fault in the DC high-voltage and high-current circuit, it will not only affect the operation safety of the electrical equipment, but also cause damage to the electrical equipment due to the existence of various inductive loads and circuit distributed inductance in the circuit. Therefore, it is very important to study the performance of the power consumption system when the open-circuit fault of the DC high-voltage and high-current circuit occurs. The premise is to realize the dynamic simulation of open-circuit faults in DC high-voltage and high-current circ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R31/02
Inventor 杨林羌嘉曦
Owner SHANGHAI 01 POWER TECH
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