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Test method and test device of NOR flash memory

A flash memory device and testing method technology, applied in static memory, instruments, etc., can solve problems such as inability to reuse, and achieve the effect of improving the same measurement, high accuracy and high test efficiency

Active Publication Date: 2016-05-11
HONGQIN (BEIJING) TECHNOLOGY CO LTD
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  • Abstract
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  • Application Information

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Problems solved by technology

However, the data signal is a two-way signal. It is the same as the input of each chip under test, but the output of the failed chip will show different results from the normal chip, so it cannot be reused. Therefore, it is necessary to provide data for each chip. The signal is assigned to an independent test channel, so that the data channel becomes an important factor affecting the number of occupied test channels

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  • Test method and test device of NOR flash memory

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0029] see figure 1 , which is a system diagram of the testing method of the present invention. Such as figure 1 Shown, a kind of testing method of NOR flash memory device of the present invention, it places NOR flash memory device on automatic testing machine, carries out chip execution write operation and read operation test on NOR flash memory device, test result is fed back by a data pin of chip Give the automated testing machine a judgment. Specifically inc...

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Abstract

The invention provides a test method and test device of an NOR flash memory. The NOR flash memory is placed on an automatic test machine; chip write operation and read operation tests are carried out on the NOR flash memory; a test result is fed back to the automatic test machine for judgment through a data pin of the chip. Compared with the prior art, in adoption of the method and the device of the invention, the test channel number occupied by the automatic test machine is compressed in testing the NOR flash memory; the simultaneous test degree is improved; and the test cost is saved.

Description

technical field [0001] The invention relates to the field of data storage, in particular to a testing method and device for a NOR flash memory device. Background technique [0002] NOR flash memory devices will be tested on an automated testing machine during mass production to ensure that the products that leave the factory are all qualified. [0003] At present, in the semiconductor industry, automated testing machines for testing NOR flash memory devices are expensive, depreciated quickly, and have fixed testing channels. This means that if a chip occupies more test channels on an automated test machine, fewer chips can be tested at the same time. Considering the factors of test time and test machine depreciation, the average cost of a single chip The higher the cost of testing. For NOR flash memory particles on an automated testing machine, the address signal and control signal are the input signals of the chip, which can be multiplexed by all the chips to be tested, t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56G11C29/44
CPCG11C29/44G11C29/56008G11C29/56016
Inventor 张涛杨建利周洋
Owner HONGQIN (BEIJING) TECHNOLOGY CO LTD