Non-contact probe signal loading device

Abstract

The invention provides a non-contact probe signal loading device. The non-contact probe signal loading device comprises a probe metal sheet which is electrically connected to a signal loading end, and the lower portion of the probe metal sheet faces a signal accessing metal sheet needing to be loaded with a signal; the probe metal sheet and the signal accessing metal sheet form a signal transmission capacitor, and the loaded signal is transmitted to the signal accessing metal sheet through the probe metal sheet by taking the signal transmission capacitor as a medium. According to the non-contact probe signal loading device, a non-contact probe is designed through the direct current blocking and alternating current communicating characteristics of the capacitor, the probe does not directly make contact with TFT glass, the signal is transmitted through the capacitor effect, and the problem that the probe scratches or pricks the TFT glass to cause cracks is solved.

Description

technical field [0001] The invention relates to the field of optoelectronics and electric vacuum, in particular to a non-contact probe signal loading device. Background technique [0002] In the production process of TFT-LCD process, the TFT glass will be electrically inspected after completing all the processes at the array end. At this time, a probe signal loading device is needed to load the signal to the TFT glass signal access metal sheet (Pad), and the signal access The metal sheet uses the metal wire to transmit the signal, the gate metal wire of the TFT switch controls the TFT switch to open, the source signal wire charges the pixel electrode, after the charging is completed, the electron gun emits electrons to bombard the TFT glass surface, the same sex repels each other, and the pixel is charged normally Secondary electrons can be returned, and abnormally charged pixels cannot return the same number of secondary electrons. Collecting secondary electrons will form a...

AI Technical Summary

Problems solved by technology

[0005] 1. Contact signal loading can easily cause scratches or damage to the TFT glass, resulting in cracks, resulting in an increase in the defective rate of the panel;

[0006] 2. Since the detection model of the detection equipment is often switched, the probe signal loading device must also be switched accordingly, which can easily lead to damage (broken or broken) of the probe during the transportation process;

[0007] 3. Since the electron gun needs a high-vacuum environment to work normally, the probe signal loading device also works in a high-vacuum environment. Once an abnormal signal loading occurs and the pixel electrode is abnormally charged, it cannot be tested normally. It is necessary to break the high-vacuum environment of the equipment and replace it The probe signal loading device is extracted and manually modified and corrected, which is time-consuming and laborious

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