Double-planar-array three-dimensional plotting system based on minisatellite platform

A technology of three-dimensional surveying and mapping and satellite platforms, which is applied in surveying and navigation, surveying devices, photogrammetry/video metrology, etc. It can solve the problems of high attitude stability requirements of satellite platforms, inability to transmit data in real time, and complicated processing methods. Achieve the effects of reducing the risk of launch failure, shortening the update cycle, and reducing update costs

Inactive Publication Date: 2016-06-08
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF6 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention provides a double-sided array three-dimensional surveying and mapping system based on a small satellite platform in order to solve the problems of the existing surveying a

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-planar-array three-dimensional plotting system based on minisatellite platform
  • Double-planar-array three-dimensional plotting system based on minisatellite platform
  • Double-planar-array three-dimensional plotting system based on minisatellite platform

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0022] Specific implementation mode 1. Combination Figure 1 to Figure 8 In this embodiment, the double-sided array three-dimensional mapping system based on the small satellite platform includes a star system, a measurement and control system, an attitude and orbit control system, a power supply system, a thermal control system, a first star sensor, a second star sensor, a digital Transmission system, three-axis gyroscope, front-view area array camera, rear-view area array camera and front-to-back optical system on-track angle detection system. The front-view area array camera and the rear-view area array camera share the imaging and focusing controller; the on-track angle detection system of the front- and rear-view optical system is used to detect the change of the on-track angle of the front-view optical system and the rear-view optical system in real time.

[0023] The front-view area array camera includes a front-view optical system, a front-view focusing motor, a front-...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a double-planar-array three-dimensional plotting system, in particular to a double-planar-array three-dimensional plotting system based on a minosatellite platform, and aims to solve the problems that a processing method of an existing plotting system is complicated, requirements for attitude stability of a satellite platform is high, data cannot be transmitted in real time, processing is inconvenient and the like. The plotting system comprises a house-keeping system, a measurement and control system, an attitude and orbit control system, a power supply system, a thermal control system, a first star sensor, a second star sensor, a data transmission system, a three-axis gyroscope, a foresight planar array camera, a rearview planar array camera and a foresight and rearview optical system in-orbit included angle detection system. The foresight planar array camera and the rearview planar array camera share an imaging and focusing controller; the foresight and rearview optical system in-orbit included angle detection system is used for detecting the changes of a foresight and rearview optical system in-orbit included angle in orbit in real time. The system develops a large-scale double-planar-array three-dimensional plotting research based on a minisatellite in combination with satellite-borne integration and low-orbit operation techniques, reduces the requirements for satellite attitude and orbit measurement accuracy and can realize plotting without the aid of control points.

Description

technical field [0001] The invention relates to a double-sided array three-dimensional surveying and mapping system, in particular to a double-sided array three-dimensional surveying and mapping system based on a small satellite platform that can realize large-scale three-dimensional surveying and mapping. Background technique [0002] The main task of transmission-type large-scale three-dimensional surveying and mapping satellites is to obtain three-dimensional image information of the earth's surface, implement precise positioning of targets, and measure and produce digital topographic maps, digital elevation models and digital image maps. With the single line array technology system, it is necessary to construct the same-orbit or different-orbit stereoscopic images through side swing, which requires extremely high mobility of the satellite platform and high requirements for the attitude stability of the platform. The dual-line array photography mode can achieve continuous...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01C11/00
CPCG01C11/00
Inventor 余达刘金国孔德柱苗健宇巩盾陈佳豫徐东
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products