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Pulse waveform testing method

A test method and pulse waveform technology, applied in the field of single-event effect research, which can solve the problems of inaccurate single-event transient pulse modeling, etc.

Active Publication Date: 2016-06-15
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a pulse waveform test method for solving the problems of inaccurate modeling of single-event transient pulses in the prior art.

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Embodiment Construction

[0035] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0036] see Figure 2 ~ Figure 6 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arbi...

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Abstract

The invention provides a pulse waveform testing method. The method comprises that single-particle bombardment information is collected, and single-particle transient pulses are generated; the pulse widths of the single-particle transient pulses in different voltage values are detected, and pulse signals of the corresponding widths are generated; the pulse width of the single-particle transient pulses in the present voltage value is calibrated according to the pulse signals, of the corresponding widths, generated in the different voltage values; and the pulse widths calibrated in different voltage values are integrated, and the waveform of the single-particle transient pulses is reduced. The pulse waveform testing method can be used to measure the real waveform of single-particle effect, and further establish a more accurate transient current pulse model of the single-particle effect, and the testing method has significance in reinforced design for anti-radiation circuits.

Description

technical field [0001] The invention relates to the field of single event effect research, in particular to a pulse waveform test method. Background technique [0002] The single event effect refers to a radiation effect that causes abnormal changes in the state of the device when a single high-energy particle passes through the sensitive area of ​​the microelectronic device, including single event upset (Single event upset), single event lockup (Single event latchup), single event function interruption, Single event transient pulse (Signal event transient, SET), single event multi-bit flip, single event burnout (Single event burnout), single event gate breakdown (Single event gate breakdown), single event disturbance and single event hard error, etc. [0003] The single event effect is one of the main radiation effects that induce abnormalities in electronic equipment. The single event transient pulse effect and single event reversal effect occur most frequently in integrat...

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Application Information

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IPC IPC(8): G01R23/16
CPCG01R23/16
Inventor 郑云龙林敏
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI