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VCM integrated performance testing method and system

A test method and test system technology, applied in instruments, optics, photography, etc., can solve problems such as unfavorable fast focusing, achieve fast focusing, and achieve the effect of vibration suppression

Active Publication Date: 2018-11-02
KUNSHAN Q TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

On the mobile phone, VCM vibration is not conducive to fast focusing, so suppressing vibration is a problem that needs to be solved

Method used

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  • VCM integrated performance testing method and system
  • VCM integrated performance testing method and system
  • VCM integrated performance testing method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] A kind of VCM integrated performance test system, it is characterized in that: comprise the power supply circuit that applies voltage to VCM two ends, be provided with the main control unit (MCU) of timer, the server that is connected with main control unit (MCU), VCM test module And the laser rangefinder connected with the VCM test module, the MCU controls the operation of the VCM test module. At a time point t (0<t<oscillation period (T)), adjust the voltage to reduce the input current i to VCM to a current value smaller than the initial current I (0<i<initial current (I)), so that The VCM generates a downward force to offset the upward oscillating force of the VCM, and on this basis, gradually increases the input current i, and finally restores the initial current I to achieve VCM oscillation suppression.

[0042] The VCM integrated performance test system of the present invention also includes an EEPROM test module, a Hall test module and a Gyro test module operated...

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Abstract

A VCM integrated performance testing method, comprising the following steps: S1: through the AD signal acquisition of the MCU, calculate the VCM resistance value, thereby obtain the voltage V that needs to be input; S2: apply the above-mentioned voltage V at both ends of the VCM by the power supply circuit, Make the corresponding initial current I pass through the VCM, and the laser range finder connected with the VCM test module, the distance figure output by it is sent back to the MCU through the VCM test module, and the MCU calculates the VCM oscillation period T, and the VCM oscillation period T uploads to the server; S3: MCU asks whether to test oscillation suppression, if so, enter the following steps: S4: Turn on the timer of MCU, adjust the voltage at a certain time point t in the first oscillation period T, and input VCM The current i is reduced to a certain current value smaller than the initial current I, so that VCM generates a downward force to offset the upward oscillating force of VCM, and on this basis, the input current i is gradually increased, and the initial current I is finally restored to realize VCM Shock suppression.

Description

technical field [0001] The invention relates to a VCM integrated performance testing method and system, in particular to a VCM integrated performance testing method and system capable of realizing oscillation suppression after completing an oscillation cycle test. Background technique [0002] When the VCM moves to a corresponding position, it has a mechanical vibration similar to that of a spring, and also has a corresponding vibration cycle. The VCM must go through a certain period of time to reach a relatively stable period. On the mobile phone, the vibration of the VCM is not conducive to fast focusing, so suppressing the vibration is a problem that needs to be solved. Contents of the invention [0003] In order to overcome the above defects, the present invention provides a VCM integrated performance testing method and system, which can continue to implement oscillation suppression after the oscillation period test is completed. [0004] The technical solution adopte...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G03B43/00
CPCG03B43/00
Inventor 丁杰许克亮张银凤
Owner KUNSHAN Q TECH CO LTD
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