Probe antenna for terahertz waveband near-field imaging

Abstract

The invention discloses a probe antenna for terahertz waveband near-field imaging and specifically relates to surface metallized coating on a narrow edge of an antenna on the basis of polymethyl methacrylate (PMMA) material manufacture. The antenna comprises a terahertz signal couple input part, a terahertz resonant cavity and a PMMA surface metallized thin film coating layer. The antenna inputs a terahertz signal via a waveguide radiator, changes the transmission mode of the terahertz signal and further effectively changes terahertz electric-field radiation, thereby achieving the aim of terahertz near-field scanning imaging. The technical field of terahertz electronic devices is related. The probe antenna of the invention has the characteristics of having a simple structure, being easy to machine and manufacture and making it easy to perform couple operation with terahertz standard waveguide. The output power and the efficiency of the probe antenna of the invention are significantly superior to those of existing terahertz near-field scanning antennas. The probe antenna has wide market prospects in terms of material defect detection and material composition identification.

Description

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AI Technical Summary

Benefits of technology

This technology improves how well an electrical probes used for testing radioactive materials have become more efficient at detecting radiation emitted from these substances. It simplifies its manufacturing process by making them easier to use with different standards' guidelines or shapes that match those specifications. Additionally, this technology allows for easy changes made on the couplings between the test device itself and other components such as signal processing circuits without having to modify any parts they were designed around.

Problems solved by technology

This patents describes various technical problem addressed in the patented text relating to improving the performance of materials' nondestructiveness tests such as X ray absorption cross section measurements. Current techniques involve bulky equipment requiring highly trained operators who may also cause damage during operation. There is therefore a desire for better ways to detect materials without having physical contact.

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