Binocular three-dimensional reconstruction method

A 3D reconstruction, binocular technology, applied in the field of computer vision, can solve the problem of easy occurrence of abnormal points and affect the reconstruction effect of 3D models, and achieve the effect of reducing abnormal points and reducing the false matching rate.

Active Publication Date: 2016-08-24
HUIZHOU FRONT OPTOELECTRONIC TECH CO LTD
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Problems solved by technology

The usual binocular 3D reconstruction method, the basic process includes: (1) image acquisition, (2) feature extraction, (3) feature matching, (4) 3D coordinate calculation, the problem after the reconstruction is that step (4) 3D coordinate Abnormal points are easy to appear in the calculation, which will affect the reconstruction effect of the 3D model

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Embodiment Construction

[0010] The present invention will be further described in detail below in conjunction with specific embodiments and with reference to the drawings.

[0011] The idea of ​​the present invention is that in the method for reconstructing a binocular three-dimensional model, the main error in the reconstruction of the three-dimensional model comes from points in the three-dimensional model that do not conform to the actual situation. In the reconstruction process, the feature extraction process is susceptible to various noises and dual-lens distortion correction errors that are widely present in the environment, which leads to mismatches due to similar features in the feature matching process, which leads to the above-mentioned inconsistencies during reconstruction. Point. In the present invention, by adopting the epipolar geometric constraint detection, the mismatched feature point pairs are effectively removed.

[0012] Such as figure 1 As shown, the flowchart of the three-dimensiona...

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Abstract

The invention discloses a binocular three-dimensional reconstruction method comprising the following steps of: 1) acquiring an image of an object to be reconstructed by two image acquisition apparatuses with the same model in order to obtain a left image and a right image; 2) calibrating the image acquisition apparatuses by a chessboard method, computing the internal and external parameter and a lens distortion coefficient, processing the left image and the right image to remove distortion in the images; 3) extracting features from the two processed images in the step 2) to obtain the feature points of the two images; 4) matching the feature points by using the feature points of the two images in the step 3) to obtain feature point pairs; 5) performing epipolar geometric constraint detection on the obtained feature point pairs to remove mismatched feature point pairs; and 6) computing three-dimensional coordinates of corresponding points, in a world coordinate system, of the obtained feature points by using the reserved feature point pairs. The binocular three-dimensional reconstruction method may reduce abnormal points and acquires an accurate three-dimensional reconstruction model.

Description

【Technical Field】 [0001] The invention relates to computer vision, in particular to a binocular three-dimensional reconstruction method. 【Background technique】 [0002] Three-dimensional model reconstruction is a very important research field in computer vision, and it has been widely used in the three major fields of industry, medicine, and entertainment. At present, three-dimensional model reconstruction is divided into four categories according to technical methods, using structured light reconstruction methods, reconstruction methods using tomography, reconstruction methods using time of flight, and reconstruction methods using stereo imaging. Among them, stereo imaging reconstruction methods are mainly divided into two categories, namely, a reconstruction method using a single image and a reconstruction method using multiple images. The method of using single image reconstruction can be summarized into shape from X, such as shape from contour (contour-based reconstruction),...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T17/00
CPCG06T17/00G06T2200/08
Inventor 马建设魏云峰刘彤苏萍
Owner HUIZHOU FRONT OPTOELECTRONIC TECH CO LTD
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