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Optical device spectrum response measurement method and measurement device based on double sideband modulation and stimulated Brillouin scattering effect

A technology of stimulated Brillouin and scattering effects, which can be used in measurement devices, optical instrument testing, testing optical fiber/optical waveguide equipment, etc., and can solve problems such as inability to measure phase-frequency response.

Active Publication Date: 2016-08-31
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Problems solved by technology

However, the disadvantage of this method is that it can only measure the amplitude-frequency response, not the phase-frequency response.

Method used

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  • Optical device spectrum response measurement method and measurement device based on double sideband modulation and stimulated Brillouin scattering effect
  • Optical device spectrum response measurement method and measurement device based on double sideband modulation and stimulated Brillouin scattering effect
  • Optical device spectrum response measurement method and measurement device based on double sideband modulation and stimulated Brillouin scattering effect

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Embodiment Construction

[0026] The technical scheme of the present invention is described in detail below in conjunction with accompanying drawing:

[0027] The idea of ​​the present invention is to add an optical carrier that is coherent with the original optical carrier and has a small frequency difference to the optical double sideband modulation signal passing through the device under test, so that after the photodetector beats, the microwave components corresponding to the ±1st order sideband With different frequencies, the magnitude response information on the ±1st order sidebands can be extracted simultaneously. However, the method of adding the frequency-shifted carrier in the present invention is to use the stimulated Brillouin scattering effect to amplify the negative first-order sideband of the frequency-fixed double-sideband signal, suppress the positive first-order sideband, and the negative first-order sideband is as the frequency-shifted carrier.

[0028] figure 1 An embodiment of th...

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Abstract

The invention discloses an optical device spectrum response measurement method based on double sideband modulation and stimulated Brillouin scattering effect, comprising steps of dividing an optical carrier wave which is outputted by a light source into two paths, performing frequency-beating in a photoelectric detector by a scanning frequency double sideband signal and a carrier having the frequency shifted after the signal passes through the optical device to be detected, obtaining two radio frequency signals which have two different frequencies and carry spectral response information of the optical device to be detected at the scanning frequency double sideband signal frequency position, using a radio frequency amplitude phase extraction module to respectively extract amplitude phase information of two radio frequency signals to obtain an amplitude-frequency response and a phase frequency response of the optical device to be detected at the optical detection signal frequency, changing the wavelength of the optical detection signal and repeating the above process to obtain the spectral vector response information of the optical device to be detected. The invention also discloses an optical device spectrum response measurement device based on the double sideband modulation. Compared with the prior art, the optical device spectrum response measurement method and measurement device greatly improve the measurement range and the measurement efficiency.

Description

technical field [0001] The invention relates to a method for measuring an optical device, in particular to a method and device for measuring the spectral response of an optical device based on double sideband modulation and stimulated Brillouin scattering effect, and belongs to the technical fields of optical device measurement and microwave photonics. Background technique [0002] The measurement of amplitude-frequency response and phase-frequency response (spectral response) of photonic devices is very critical for device manufacturing and system design. In recent years, with the rapid development of laser technology, photonic systems have been widely used, such as ultra-high-precision optical fiber sensing, long-distance optical fiber communication, etc. However, the development of optical measurement technology has stagnated, which not only makes it difficult to develop and manufacture high-precision optical devices, but also makes it impossible for existing optical devi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/00G01M11/30
Inventor 潘时龙李树鹏傅剑斌卿婷薛敏
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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