Impedance test device

A technology of impedance testing and testing position, which is applied in the direction of measuring device, electronic circuit testing, measuring resistance/reactance/impedance, etc. It can solve the problems of affecting test results and measuring instrument damage, so as to avoid interference, save cost and reduce probes Quantity effect

Active Publication Date: 2019-02-12
JOINT STARS TECH
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Therefore, the technical problem to be solved by the present invention is to overcome the impedance testing device with three or more probes in the prior art. The test interferes, affects the test result, and even causes a short circuit to cause damage to the measuring instrument, so as to provide a way that when two of the needles are used for an impedance test, the unused probe will not interfere with the impedance test. An impedance test device with three or more probes that has more accurate test results and does not cause short circuits

Method used

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Embodiment approach

[0057] The specific structural forms of the switching installation mechanism can be various. As a specific implementation mode, the switching installation mechanism includes:

[0058] mount 1;

[0059] The movable support 3 is arranged vertically relative to the mounting base 1 and can move back and forth in the vertical direction relative to the mounting base 1; the probe is installed at its lower end;

[0060] The power device is arranged between the installation seat 1 and the movable support 3 , and drives the movable support 3 to move relative to the installation seat 1 .

[0061] The above switching installation mechanism controls the switching between the test position and the non-test position of the probe mounted on the movable support 3 through the power device, and has a simple structure, convenient operation and stable switching state.

[0062] There may be various specific forms of the power device. In this embodiment, the power device includes a controllable for...

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Abstract

The invention provides an impedance test apparatus. The impedance test apparatus comprises a switching installation mechanism and at least three probes, wherein the probes are grounding probes or signal probes, the probes are installed on the switching installation mechanism, and a part of or all of the probes are driven by the switching installation mechanism to realize switching between test positions and non-test positions; and every time the switching installation mechanism drives two selected probes to reach the test positions in a combination mode of one signal probe and one another signal probe or in a combination mode of one signal probe and one grounding probe, and other non-selected probes are switched to the non-test positions. According to the impedance test apparatus, when the two selected probes are used for an impedance test, the non-selected probes are away from a circuit board to be tested so as to prevent contact with other positions of the circuit board to be tested, no interference is caused to the test, the accuracy of a test result is guaranteed, and at the same time, a measurement instrument is prevented from damage caused by a short circuit.

Description

technical field [0001] The invention relates to the technical field of impedance testing, in particular to an impedance testing device. Background technique [0002] With the continuous advancement of communication technology, the communication rate is getting higher and higher, and more and more users have put forward requirements for impedance control and signal frequency for PCB board routing. Impedance testing generally includes single-ended impedance testing and differential impedance testing, wherein single-ended impedance testing is generally performed through a single-ended impedance probe assembly, and differential impedance testing is generally performed through a differential impedance probe assembly. The single-ended impedance probe assembly typically includes a signal probe and a ground probe, and the differential impedance probe assembly typically includes two signal probes. [0003] Since it is necessary to switch different impedance probe components for diff...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01R27/02G01R31/28G01R1/073
CPCG01R1/07357G01R1/07392G01R27/02G01R31/2812
Inventor黄韬
OwnerJOINT STARS TECH