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High temperature calibration method of free space terminal short circuit method complex dielectric constant test system

A technology of complex dielectric constant and terminal short circuit method, which is applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve problems such as variable temperature complex dielectric constant errors, and achieve the effect of improving test accuracy and effective calibration

Active Publication Date: 2016-09-28
成都恩驰微波科技有限公司
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Problems solved by technology

If the normal temperature SOL calibration data is still used to derive the S at the end surface of the material to be tested 11 parameter, the variable temperature complex permittivity derived from this inversion will produce a large error, so there are defects in the prior art and need to be improved

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  • High temperature calibration method of free space terminal short circuit method complex dielectric constant test system
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  • High temperature calibration method of free space terminal short circuit method complex dielectric constant test system

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Embodiment Construction

[0036] Embodiments of the present invention will be described below in conjunction with the drawings and specific examples. Those skilled in the art can understand other advantages and effects of the present invention from the content disclosed in this specification.

[0037] figure 1 The configuration diagram of the material testing system for the free space terminal short circuit method. Such as figure 1 As shown, the main test instrument of the free space terminal short-circuit method material testing system is a vector network analyzer 1, one port of which is connected to the antenna 4 (commonly used point-focusing lens antenna) through a microwave cable 3, and a metal reflector 6 is placed at the focal plane of the antenna. The material to be tested 5 is placed on the metal reflector, and the vector network analyzer can be used for data collection and calculation by the program-controlled computer 2 through the LAN bus.

[0038] This embodiment discloses a high-temperatu...

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Abstract

The invention provides a high temperature calibration method of a free space terminal short circuit method complex dielectric constant test system. After a vector network analyzer carries out calibration, reflection parameters of a system when connects different calibration components under a normal temperature and variable temperatures are measured; through combining a preset formula, an error item is derived and an actual reflection parameter of the system which passes through a material to be measured and carries out reflection under a variable temperature environment is acquired. In the invention, through establishing a variable temperature environment separation error item reflection model, an antenna transmission / reflection segment system error item under a normal temperature is acquired and an air transmission segment phase change influence under a high temperature is corrected so that calibration of a free space terminal short circuit method material varying temperature test system can be effectively performed and test precision of the free space terminal short circuit method under the variable temperature environment is increased.

Description

technical field [0001] The invention belongs to the technical field of calibration of a material complex permittivity variable temperature test system, and in particular relates to a high-temperature calibration method for a complex permittivity test system by a free space terminal short circuit method. Background technique [0002] Microwave materials are often used in various fields such as aerospace, satellite communications, radar navigation, and infrared remote sensing. Airplanes, missiles, rockets, spacecraft, etc. flying at high altitudes, due to the friction between the atmosphere and the high-speed flight state, the temperature of the microwave materials on the surface is very high, and the distribution is not the same. The electromagnetic parameters change nonlinearly, which will have a great influence on the transmission of electromagnetic waves. Therefore, it is very important to accurately test the electromagnetic parameters of microwave materials in high-tempe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
CPCG01R35/005
Inventor 张云鹏李恩陈亮亮郑虎郭高凤
Owner 成都恩驰微波科技有限公司
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