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High temperature calibration method of complex dielectric constant test system by free space terminal short circuit method

A technology of complex permittivity and terminal short-circuit method, which can be used in measuring devices, measuring electrical variables, instruments, etc., to solve problems such as temperature-variable complex permittivity errors, and achieve the effect of improving test accuracy and effective calibration.

Active Publication Date: 2018-09-18
成都恩驰微波科技有限公司
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AI Technical Summary

Problems solved by technology

If the normal temperature SOL calibration data is still used to derive the S at the end surface of the material to be tested 11 parameter, the variable temperature complex permittivity derived from this inversion will produce a large error, so there are defects in the prior art and need to be improved

Method used

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  • High temperature calibration method of complex dielectric constant test system by free space terminal short circuit method
  • High temperature calibration method of complex dielectric constant test system by free space terminal short circuit method
  • High temperature calibration method of complex dielectric constant test system by free space terminal short circuit method

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Embodiment Construction

[0036] Embodiments of the present invention will be described below in conjunction with the drawings and specific examples. Those skilled in the art can understand other advantages and effects of the present invention from the content disclosed in this specification.

[0037] figure 1 The configuration diagram of the material testing system for the free space terminal short circuit method. like figure 1 As shown, the main test instrument of the free space terminal short-circuit method material testing system is a vector network analyzer 1, one port of which is connected to the antenna 4 (commonly used point-focusing lens antenna) through a microwave cable 3, and a metal reflector 6 is placed at the focal plane of the antenna. The material to be tested 5 is placed on the metal reflector, and the vector network analyzer can be used for data collection and calculation by the program-controlled computer 2 through the LAN bus.

[0038] This embodiment discloses a high-temperature ...

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Abstract

The invention provides a high-temperature calibration method for a free-space terminal short-circuit method complex dielectric constant test system. After calibrating a vector network analyzer, measure the reflection parameters of the system when different calibration parts are connected at normal temperature and variable temperature, and deduce it in combination with preset formulas. The error term obtains the actual reflection parameters that pass through the material to be tested and reflects under the variable temperature environment; the present invention obtains the system error term of the antenna transmission / reflection section at normal temperature by establishing a reflection model of the variable temperature environment to separate the error term, and corrects the air transmission section at high temperature The influence of the phase change can more effectively calibrate the material variable temperature test system of the free space terminal short circuit method, and improve the test accuracy of the free space terminal short circuit method in the variable temperature environment.

Description

technical field [0001] The invention belongs to the technical field of calibration of a material complex permittivity variable temperature test system, and in particular relates to a high-temperature calibration method for a complex permittivity test system by a free space terminal short circuit method. Background technique [0002] Microwave materials are often used in various fields such as aerospace, satellite communications, radar navigation, and infrared remote sensing. Airplanes, missiles, rockets, spacecraft, etc. flying at high altitudes, due to the friction between the atmosphere and the high-speed flight state, the temperature of the microwave materials on the surface is very high, and the distribution is not the same. The electromagnetic parameters change nonlinearly, which will have a great influence on the transmission of electromagnetic waves. Therefore, it is very important to accurately test the electromagnetic parameters of microwave materials in high-tempe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
CPCG01R35/005
Inventor 张云鹏李恩陈亮亮郑虎郭高凤
Owner 成都恩驰微波科技有限公司
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