Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A method for controlling the write operation of SRAM with ultra-low write power consumption

A static random and control method technology, applied in static memory, digital memory information, information storage, etc., can solve the problem of high power consumption, achieve the effect of reducing the power consumption of bit line flipping and saving the power consumption of bit line flipping

Active Publication Date: 2019-05-17
XI AN UNIIC SEMICON CO LTD
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the write operation of SRAM, usually the bit line needs full swing operation. Compared with the read operation, the bit line only needs to discharge a small voltage difference, and the small voltage difference of the sense amplifier is amplified to the full swing. Consumes more power

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for controlling the write operation of SRAM with ultra-low write power consumption
  • A method for controlling the write operation of SRAM with ultra-low write power consumption
  • A method for controlling the write operation of SRAM with ultra-low write power consumption

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054] The present invention changes the access transistor of the traditional 6-tube storage unit from an NMOS transistor to a PMOS transistor, and changes the ground connected to the source end of the original NMOS pull-down transistor into the virtual ground of the NMOS current source controlled by the write word line reverse WWL_N At the end, the traditional 6-tube storage unit is transformed into a voltage-type sense amplifier; and the sense amplifier is added in the write data path as a write data cache. During the write operation, the write data is first written into the sense amplifier through the write driver and buffered, and then the bit line is discharged through the sense amplifier, so that the full-swing write data is converted into a small signal voltage difference on the bit line and It is transmitted to the storage node of the selected 6-tube storage unit. When the voltage difference of the storage node reaches the offset voltage of the sense amplifier compose...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a static random access memory with ultralow writing power consumption and a control method of writing operation of the static random access memory. A traditional 6-tube storage unit is changed into a PMOS (P-channel Metal Oxide Semiconductor) tube from an NMOS (N-channel Metal Oxide Semiconductor) transistor and a ground end connected with a previous NMOS pulling-down tube source end is changed into a dummy ground end of an NMOS current source controlled by a writing line opposite WWL_N; the traditional 6-tube storage unit is modified into a voltage type sensitive amplifier; the sensitive amplifier is added into a writing data channel to be used as writing data cache. When writing operation is carried out, the writing data is written to the sensitive amplifier firstly and stored; an amplification line and an alignment line of the sensitive amplifier are discharged and the self amplification capability of the storage unit is utilized; the writing operation of the storage unit can be finished by only very small bit line voltage difference so that bit line overturning power consumption consumed by the writing operation is saved. Compared with traditional bit line full-swing writing operation, the bit line overturning power consumption consumed by single time of the writing operation is reduced by 4.2 times.

Description

technical field [0001] The invention relates to the field of static random access memory design, in particular to a static random access memory with ultra-low write power consumption. Background technique [0002] As an important storage element in integrated circuits, SRAM is widely used in high-performance computer systems (CPU), system-on-chip (SOC), handheld devices, etc. due to its high performance, high reliability, and low power consumption. computing field. According to the estimate of ITRS, the international semiconductor technology blueprint, by 2016, the area of ​​embedded SRAM will account for 90% of the area of ​​the entire computer system (CPU) and system on chip (SOC). The power consumed by it accounts for 40% of the whole computer system (CPU) on chip, system on chip (SOC), and dynamic power consumption accounts for about 14%. For the write operation of SRAM, usually the bit line needs full swing operation. Compared with the read operation, the bit line onl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G11C11/419
CPCG11C11/419
Inventor 熊保玉拜福君
Owner XI AN UNIIC SEMICON CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products