Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Static Random Access Memory Using Static Write Technology to Reduce Write Power Consumption

A static random and memory technology, applied in the direction of static memory, digital memory information, information storage, etc., to achieve the effect of saving power consumption and reducing flipping power consumption

Active Publication Date: 2016-12-07
XI AN UNIIC SEMICON CO LTD
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When there are continuous "0" or "1" in the write data, that is, when the value held on the bit line 115 and the bit line 118 is the same as the value of the write bit line 120 and the write bit line 121, the precharge operation and discharge operation implies additional energy loss

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Static Random Access Memory Using Static Write Technology to Reduce Write Power Consumption
  • A Static Random Access Memory Using Static Write Technology to Reduce Write Power Consumption
  • A Static Random Access Memory Using Static Write Technology to Reduce Write Power Consumption

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0027] Such as figure 2 As shown, figure 2 This is an example of a static random access memory that uses static write technology to reduce write power consumption according to the present invention. The SRAM includes a decoder 201, a memory array 202, a control circuit and predecoder 204, a bit line precharge signal generating circuit 205, a bit line precharge and equalization circuit 206, and a static write driver 207.

[0028] The decoder 201 is connected to the memory array 202 through multiple word lines (WL) 208, and the decoder 201 is also connected to the control circuit and the pre-decoder 204 through multiple pre-decoder output lines (PRE_DEC) 210;

[0029] The memory array 202 is also connected to the bit line precharge and equalization circuit 206 and the static write driver 207 through a plurality of bit lines (BL) 209;

[0030] The control cir...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a static random access memory for reducing writing power consumption by adopting a static writing technology. A bit line pre-charging signal generating circuit is used for detecting whether writing enabling is valid or not on the rising edge of a clock, and if a writing enabling signal is valid, a bit line pre-charging signal is invalid; otherwise, the bit line pre-charging signal is valid, namely, the bit line pre-charging signal is invalid during writing operation. A static writing driver consists of a phase inverter and a three-state gate; when writing enabling is valid, the output of the static writing driver is used for driving a bit line directly. Compared with the conventional static random access memory, the static random access memory has the advantages that pre-charging operation on the bit line is not needed during writing operation. When continuous '0' or '1' writing operation occurs, data kept on the bit line are the same as data needing to be written, so that the bit line is not flipped, thereby saving the power consumption. Under the condition that the flipping probability of written data is a half, the flipping power consumption of a writing bit line is lowered by 50 percent in comparison to the conventional design.

Description

【Technical Field】 [0001] The invention relates to the field of static random access memory design, in particular to a static random access memory that adopts static writing technology to reduce writing power consumption. 【Background technique】 [0002] According to the International Semiconductor Technology Blueprint (ITRS) forecast, the area of ​​SRAM will become larger and larger, and by 2014, it will account for more than 94% of the entire system-on-chip (SOC) area. Therefore, the power consumption of the SRAM will directly affect the power consumption of the entire SOC. [0003] See figure 1 As shown, figure 1 Write the data path schematic diagram for a typical SRAM. This typical data path includes bit line precharge and equalization circuits, memory cells and write drivers. [0004] The bit line precharge and equalization circuit is composed of PMOS transistors 101-103. The storage unit is composed of a pair of cross-coupled inverters 105 and 107 and NMOS transmission tubes 1...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G11C11/419
Inventor 熊保玉拜福君
Owner XI AN UNIIC SEMICON CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products