Infrared thermal image processing method based on abnormal area location

Abstract

The invention discloses an infrared thermal image processing method based on abnormal area location. The method includes the steps that infrared thermal image video streaming of a tested part is collected from heating starting to cooling finishing, each frame of image is divided in an equal area mode, a Pearson correlation coefficient curve of each area is obtained through calculation according to the frame interval,gross errordetection is carried out on a Pearson correlation coefficient sequence before and after the heating finishing moment, and when it is judged that a gross error exists, the area is judged to be an abnormal area; authenticity of the abnormal area is judged to obtain an authenticity abnormal area; askewness value of an infrared thermal response sequence of each pixel point in the authenticity abnormal area is calculated, infrared thermal response of pixel points with the skewness values larger than the threshold value is enhanced, and infrared thermal response of the other pixel points is weakened, so that the infrared thermal image video streaming with the abnormal area enhanced is obtained. Analysis is carried out from the image area information extractionperspective, interference caused by nonuniform thermal emissivity on the surface of a material is inhibited, and defect characteristics are enhanced.

Description

technical field [0001] The invention belongs to the technical field of infrared thermal image processing, and more specifically relates to an infrared thermal image processing method based on abnormal region positioning. Background technique [0002] At present, infrared thermal imaging non-destructive testing technology has become an important branch of non-destructive testing. In the infrared thermal imaging non-destructive testing technology, the research on defect extraction and image enhancement has achieved certain results. However, in practical applications, the surface of the test material for non-destructive testing is not smooth or completely clean, and its surface layer is usually There are oil stains, paint coatings or oxide layers, which can seriously cause uneven thermal emissivity distribution on the surface of the material. The signal-to-noise ratio of directly extracted frame images is generally low due to the spurious temperature changes produced by the un...

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Problems solved by technology

[0007] The purpose of the present invention is to overcome the deficiencies of the prior art, provide an infrared thermal image processing method based on abnormal area positioning, analyze from the angle of image area information extraction, realize the suppression of interference caused by uneven thermal emissivity on the surface of materials, and enhance Defect characteristics, convenient for subsequent analysis and processing

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