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No-reference SH wave guide method used for flat plate thinning defect quantitative detection

A technology of flat plate and defects, applied in the field of non-destructive testing, which can solve the problem of not being able to quantitatively give the exact position and specific shape of defects

Inactive Publication Date: 2016-10-12
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Problems solved by technology

[0004] The purpose of the present invention is to provide a non-reference SH guided wave method for the quantitative detection of flat plate thinning defects, aiming to solve the problem that the exact position and specific shape of the defect cannot be quantitatively given in the current defect detection and evaluation

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  • No-reference SH wave guide method used for flat plate thinning defect quantitative detection

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[0063] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0064] The application principle of the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0065] A non-reference SH guided wave method for quantitative detection of plate thinning defects, using non-reference SH guided waves to reconstruct the plate defect, and give the specific position and shape of the defect. The method includes the following steps:

[0066] S101: Separating the modes of the total field to obtain the reflection coefficient of the required SH guided wave mode: using the orthogonality between different modes of the elastic wave to se...

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Abstract

The invention discloses a no-reference SH wave guide method used for flat plate thinning defect quantitative detection. Defect reconstruction is conducted on a flat plate by means of no-reference SH wave guide, and the specific position and shape of a defect are given. The method includes the steps that mode separation is conducted on a total field, and a reflection coefficient of a required SH wave guide mode is obtained; a green function in the no-defect flat plate is solved, and a approximate solution of a far field is obtained; a boundary integral equation is solved, and the shape of the defect in the flat plate is reconstructed in a no-reference mode. The method relates to a quantitative detection technology, people do not need to refer to the approximate position of the defect in advance, a defect expression is directly induced theoretically, a whole component can be detected at a time, an efficient and precise scheme is provided for ultrasonic wave guide quantitative detection, the method has important application value in engineering, and a whole structure can be detected at a time. Detection can be conducted without removing coating and insulating layers, and complex rotating and walking devices are not needed. Defect sensitivity and precision are high, energy consumption is low, and the method is economical.

Description

technical field [0001] The invention belongs to the technical field of non-destructive testing, and in particular relates to a non-reference SH guided wave method for quantitative detection of plate thinning defects. Background technique [0002] With the development of science and technology, the requirements for defect detection and evaluation in the machinery, construction and aerospace industries are getting higher and higher. It is no longer only satisfied with the detection of defect positions and fuzzy shapes, but needs to quantitatively give the exact position and details of defects. shape. [0003] Conventional non-destructive testing and evaluation methods in the industry include magnetic particle testing, radiographic testing, eddy current testing, ultrasonic testing, etc. Among them, ultrasonic non-destructive testing is a widely used testing method. Due to its high frequency and short wavelength, ultrasonic waves can interact with tiny features in structures su...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N29/04G01N29/44
CPCG01N29/04G01N29/44G01N2291/0237
Inventor 王彬笪益辉钱征华
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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