Testing probe and testing method for ripples and noises of power supply

A power supply ripple and noise testing technology, applied in power supply testing, noise figure or signal-to-noise ratio measurement, etc., can solve problems such as low test efficiency, save labor cost, high test accuracy, and improve test efficiency.

Inactive Publication Date: 2016-10-12
UBTECH ROBOTICS CORP LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is to provide a power supply ripple and noise test probe for the low test efficiency of existing passive probes used for single-board power supply ripple and noise testing

Method used

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  • Testing probe and testing method for ripples and noises of power supply
  • Testing probe and testing method for ripples and noises of power supply
  • Testing probe and testing method for ripples and noises of power supply

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Embodiment Construction

[0026] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0027] like Figure 1 to Figure 3 As shown, the power supply ripple noise test probe provided by an embodiment of the present invention includes a test clip 1, a DC blocking capacitor 2 and a coaxial cable 3, wherein the DC blocking capacitor can be a DC blocking capacitor with a capacitance of 10uf, The coaxial cable 3 is a coaxial cable that matches the impedance of the oscilloscope channel, for example, it may be a 50 ohm impedance coaxial cable or the like.

[0028] The test clip 1 includes an insulating shell 11 , a positive electrode and a ground wire (GND) fixed ...

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Abstract

The invention provides a testing probe and testing method for ripples and noises of a power supply. The testing probe comprises a testing clamp, a blocking capacitor, and a coaxial line. The testing clamp consists of an insulating housing, a positive electrode, and a ground wire, wherein the positive electrode and the ground wire are fixed in the insulating housing. The insulating housing includes a first clamp leg, a second clamp leg, and a connecting part; at least one of the first clamp leg, the second clamp leg, and the connecting part can deform elastically. One end of the positive electrode extends out of the first clamp leg and forms a positive probe pin and the other end is connected with one end of the coaxial line. One end of the ground wire extends out of the second clamp leg and forms a ground wire probe pin and the other end is connected with one end of the coaxial line; and a connector connected with an oscilloscope is arranged at the other end of the coaxial line. The blocking capacitor is connected in series to the positive electrode. The testing probe with the high testing precision can be operated conveniently and rapidly; and compared with the passive testing probe, the testing efficiency can be improved and the manpower investment cost can be saved effectively.

Description

technical field [0001] The invention belongs to the technical field of power supply testing, and in particular relates to a power supply ripple noise test probe and a test method. Background technique [0002] The power supply on the board, such as LDO (low dropout linear voltage regulator) power supply, DC Module (DC power supply module), usually uses passive probes to test ripple and noise, and the signal probes of passive probes are not equal to the ground wire. Long, the formed loop has a large area and is susceptible to electromagnetic interference, resulting in inaccurate test data. Moreover, due to the small size of the components and parts, it is necessary to weld the ground wire for each set of data tested by using the existing passive probe. Before the test, the oscilloscope channel coupling mode needs to be set to AC 1MΩ, and other tests need to be set to DC 50Ω. The operation is cumbersome, the test efficiency is low, and the impedance of the passive probe is 1M...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40G01R29/26
CPCG01R31/40G01R29/26
Inventor 何冲熊友军
Owner UBTECH ROBOTICS CORP LTD
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