Control system and method for laser displacement sensor

Abstract

The invention discloses a laser displacement sensor control system and method. The system comprises an optical head module and a control module, wherein the optical head module comprises an FPGA processing chip, a laser drive circuit and a first communication interface; the control module comprises a processor and a second communication interface, wherein the processor and the FPGA processing chip are in communication through a first communication interface and a second communication interface; the FPGA processing chip is used for determining a displacement value according to the image signal from an image sensor, and sending a determined displacement value to a processor, and under the control of the processor, outputs a laser control signal to the laser drive circuit; the laser drive circuit is used for controlling laser work parameters according to the laser control signal; the processor is used for controlling the FPGA processing chip to output the laser control signal and receiving a displacement value from the FPGA processing chip.

Description

technical field [0001] The invention relates to the field of laser measurement, and in particular, to a control system and method for a laser displacement sensor. Background technique [0002] Displacement sensors are components used to measure changes in the position of objects and output the measurement results with digital or analog signals. According to the working principle, displacement sensors can be divided into inductive displacement sensors, capacitive displacement sensors, photoelectric displacement sensors, ultrasonic displacement sensors and Hall displacement sensors. [0003] With its excellent measurement performance, the laser displacement sensor can realize non-contact online measurement of displacement, three-dimensional size, thickness, surface contour, object deformation, vibration, liquid level and other parameters, and can provide effective information for workpiece sorting and installation of various large components. Support (for example, it can assi...

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Problems solved by technology

However, in this solution, the patent does not involve how to control the working mode of the FPGA

Therefore, the solution disclosed in this patent has the following defects: neither ARM nor FPGA interacts with the measurement equipment, only passively receives and processes data, and cannot control the measurement equipment. If the current working state of the measurement equipment is the actual measurement environment Inconsistency will affect the measurement results, and the effect is poor when applied in large-scale production monitoring scenarios

[0006] For the above problems, no effective solutions have been proposed so far

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