Structured light 3D scanning measurement device and method
A three-dimensional scanning and measuring device technology, applied in the field of optical measurement, can solve problems such as loss, and achieve the effect of reducing the cost of soft and hard, reducing the sensitivity requirements of the device, and improving the strength
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[0036] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following will further describe the technical solutions in the embodiments of the present invention clearly, completely and in detail with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art fall within the protection scope of the present invention.
[0037] According to an embodiment of the present invention, a structured light three-dimensional scanning measurement device is provided.
[0038] Such as figure 1 As shown, the structured light three-dimensional scanning measurement device provided according to the embodiment of the present invention includes:
[0039] The optical projecto...
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