Structured light 3D scanning measurement device and method

A three-dimensional scanning and measuring device technology, applied in the field of optical measurement, can solve problems such as loss, and achieve the effect of reducing the cost of soft and hard, reducing the sensitivity requirements of the device, and improving the strength

Inactive Publication Date: 2016-12-07
湖南维纳斯克三维科技有限公司
View PDF5 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problem that the length of the projection line cannot be continuously adjusted and the projected energy is ineffectively lost in the prior art, the purpose of the present invention is to propose a structured light three-dimensional scanning measurement device and method, which can continuously adjust the length of the projection line according to the needs of the scene without requiring many Replace the filter at one time; at the same time, the projection energy is no longer lost when adjusting the length of the projection line, which enhances the imaging capability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Structured light 3D scanning measurement device and method
  • Structured light 3D scanning measurement device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following will further describe the technical solutions in the embodiments of the present invention clearly, completely and in detail with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art fall within the protection scope of the present invention.

[0037] According to an embodiment of the present invention, a structured light three-dimensional scanning measurement device is provided.

[0038] Such as figure 1 As shown, the structured light three-dimensional scanning measurement device provided according to the embodiment of the present invention includes:

[0039] The optical projecto...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a structured light 3D scanning measurement device and method. The device comprises an optical projector arranged on a projection frame, a reflection mirror, a projection frame, and a measurement target. The optical projector can output projection light. The light out direction of the optical projector just faces the reflection surface of the reflection mirror. The light out direction of the optical projector is fixed. The reflection mirror is arranged on the projection frame and comprises a reflection surface. The projection light of the optical projector is skewed to the reflection surface of the reflection mirror. The reflection surface of the reflection mirror reflects the projection light of the optical projector to the surface of the measurement target. The projection frame is arranged far from the measurement target and is fixedly connected to the optical projector and the reflection mirror. The distance from the projection frame to the measurement target is known. The measurement target receives the projection light reflected by the reflection mirror and carries out diffuse reflection.

Description

Technical field [0001] The invention relates to optical measurement technology, in particular to a structured light three-dimensional scanning measurement device and method. Background technique [0002] The structured light three-dimensional vision measurement technology in the prior art refers to the use of an optical projector to replace one of the cameras in the binocular stereo vision measurement, and the optical projector generates certain light patterns, such as light planes, cross light planes, and nets. Lattice beams, etc., constrain the spatial position of the scene object, so that the three-dimensional coordinates of the selected point on the scene object are obtained. [0003] Conventional structured lights, such as grid lattices, gratings, projection lines, etc., cannot be effectively adjusted according to changes in imaging distance and range, making structured lights difficult to effectively apply to long-distance indoor or outdoor environments. The general projecti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 欧建良王兵海邓庆华徐玉华刘海军孙焱潘胜强曾琳琳
Owner 湖南维纳斯克三维科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products