Substrate detection device
A substrate inspection and substrate technology, which is applied in the field of optical inspection, can solve the problems of operator line of sight interference, time-consuming inconvenience, turbulent flow, etc., to avoid light refraction and reflection and turbulent flow, ensure accuracy, and avoid damage Effect
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[0019] The following will clearly and completely describe the technical solutions of the exemplary embodiments provided by the present invention with reference to the accompanying drawings in the embodiments of the present invention. In the case of no conflict, the following embodiments and the technical features in the embodiments can be combined with each other. Moreover, the directional terms used throughout the present invention, such as "upper" and "left", are all for better describing various embodiments, and are not used to limit the protection scope of the present invention.
[0020] see image 3 , is a substrate inspection device according to an embodiment of the present invention. The substrate inspection device 20 includes an illumination assembly 21 , a supporting assembly 22 and a platform 23 . The lighting assembly 21 includes a light source 211 , an electric control assembly 212 and an optical fiber 213 for electrically connecting the light source 211 and the ...
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