Unlock instant, AI-driven research and patent intelligence for your innovation.

Substrate detection device

A substrate inspection and substrate technology, which is applied in the field of optical inspection, can solve the problems of operator line of sight interference, time-consuming inconvenience, turbulent flow, etc., to avoid light refraction and reflection and turbulent flow, ensure accuracy, and avoid damage Effect

Active Publication Date: 2016-12-07
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Wherein, the light source 111 of the lighting assembly 11 and the optical fiber 112 for powering the light source 111 are hung above the platform 13, that is, above the operator. This design is likely to cause some problems during detection, for example: 1. The optical fiber 112 is long, and it is easy to touch the grating 14 located on both sides of the detection window due to shaking, resulting in the shutdown of the entire substrate detection device 10; It is also easy to touch the substrate 15 to be detected, causing damage or even breaking of the substrate 15 to be detected; 3. The shaking optical fiber 112 is prone to light refraction and reflection, which will interfere with the operator's line of sight and affect the accuracy of the detection results Four, the shaking of the optical fiber 112 will cause turbulent flow, which will affect the cleanliness of the detection environment; five, the components 113 for controlling the light source 111 of the lighting assembly 11, such as switch buttons, etc., are arranged on the upper left corner of the substrate detection device 10 , the distance from the platform 13 is relatively long, if the brightness of the light source 111 needs to be adjusted during the detection process, the operator needs to walk a long distance, which is time-consuming and inconvenient

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Substrate detection device
  • Substrate detection device
  • Substrate detection device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions of the exemplary embodiments provided by the present invention with reference to the accompanying drawings in the embodiments of the present invention. In the case of no conflict, the following embodiments and the technical features in the embodiments can be combined with each other. Moreover, the directional terms used throughout the present invention, such as "upper" and "left", are all for better describing various embodiments, and are not used to limit the protection scope of the present invention.

[0020] see image 3 , is a substrate inspection device according to an embodiment of the present invention. The substrate inspection device 20 includes an illumination assembly 21 , a supporting assembly 22 and a platform 23 . The lighting assembly 21 includes a light source 211 , an electric control assembly 212 and an optical fiber 213 for electrically connecting the light source 211 and the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a substrate detection device. The substrate detection device comprises an illumination assembly, a bearing assembly used for bearing a substrate to be detected, and a platform where operation personal stay, and the illumination assembly and the bearing assembly are arranged on the two opposite sides of the platform respectively. By means of the substrate detection device, it can be avoided that an optical fiber shakes and touches a raster and the substrate to be detected, downtime and damage to the substrate to be detected are avoided, and the phenomena of light refraction, light reflection and turbulence caused by shaking of the optical fiber can be avoided to ensure the accuracy of a detection result and the cleanness of the detection environment; besides, when the brightness of a light source and the like need to be adjusted, operation personnel do not need to walk about, and operation is easy and convenient.

Description

technical field [0001] The invention relates to the technical field of optical detection, in particular to a substrate detection device. Background technique [0002] The substrate inspection device is used to inspect the defects of the glass substrate, which is an important guarantee for the quality of the LCD panel. see figure 1 and figure 2 , the currently commonly used substrate inspection device 10 includes an illumination assembly 11 , a supporting assembly 12 for accommodating a substrate to be inspected, and a station 13 where an operator is located when inspecting a substrate 15 to be inspected. Wherein, the light source 111 of the lighting assembly 11 and the optical fiber 112 for powering the light source 111 are hung above the platform 13, that is, above the operator. This design is likely to cause some problems during detection, for example: 1. The optical fiber 112 is long, and it is easy to touch the grating 14 located on both sides of the detection window...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/958G01N21/88
CPCG01N21/8806G01N21/958G01N2021/9513G01N2201/061
Inventor 游镇滔
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD