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Method of testing life cycle of Nand flash

A technology of life cycle, read and write testing, applied in static memory, instruments, etc., can solve the problem of lengthy time spent, and achieve the effect of reducing the number of read/write/erase blocks and reducing the test time

Active Publication Date: 2016-12-07
BIWIN STORAGE TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above method needs to read and write each good block of Nand flash to the end of the life cycle, which takes a very long time

Method used

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  • Method of testing life cycle of Nand flash
  • Method of testing life cycle of Nand flash
  • Method of testing life cycle of Nand flash

Examples

Experimental program
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Embodiment

[0031] Please refer to image 3 , the embodiment of the present invention is a kind of method of testing Nand flash life cycle, specifically comprises the following steps:

[0032] (1) all blocks are erased, and an original bad block table is set up, wherein the original bad block table is scanned and generated according to prior art methods;

[0033] (2) set up a virtual bad block table at the tool end, the tool end refers to the mass production tool such as in the windows system, and the mass production tool is the card opening tool running on the computer, such as the card opening tool of the U disk , the virtual bad block table is a sequence of bad blocks randomly generated by the system, the total number of these virtual bad blocks is greater than the number of bad blocks in the original bad block table, and the virtual bad blocks include all The data is written into the real bad block to affect the test result. The number of bad blocks in the virtual bad block table ca...

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PUM

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Abstract

The invention discloses a method of testing life cycle of an Nand flash, including the steps of establishing an Nand flash virtual bad block table; detecting the life cycle according to the virtual bad block table. The virtual bad block table is utilized to replace an original bad block table obtained by actual scanning in the prior art, life cycle testing is performed according to the virtual bad block table, and testing time is greatly shortened.

Description

technical field [0001] The invention relates to the field of Nand flash memory, in particular to a method for testing the life cycle of Nand flash. Background technique [0002] If digital products use storage media, they have the opportunity to use Nand flash. Each firmware algorithm has different read and write times for Nand flash, and the life cycle of Nand flash is also different. carry out testing. The method of testing the life cycle in the prior art is as figure 1 As shown, first erase all blocks, scan and build a Nand flash bad block table, and then use the read and write test tool to detect the life cycle of Nand flash, specifically, test the number of times that good blocks can be written and erased one by one according to the bad block table , until all good blocks are tested, the life cycle of Nandflash is calculated, and fed back to the test system. The above method needs to read and write each good block of Nand flash until the end of the life cycle, which ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56G11C29/44
CPCG11C29/44G11C29/56
Inventor 孙日欣孙成思李振华黄善勇叶欣张翔邝祖智
Owner BIWIN STORAGE TECH CO LTD
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