Imaging uniformity testing device for large-aperture low light level image intensifier
A technology of low-light image intensifier and testing device, which is applied in the direction of optical instrument testing, measuring device, machine/structural component testing, etc. Issues such as imaging performance parameters of aperture low-light image intensifier
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0013] Combined with Figure 1(a)(b), a large-aperture low-light image intensifier imaging uniformity test device, including test device dark box 1, image acquisition SLR camera 2, SLR camera fixture 3, test uniformity of the image intensifier under the dark box The integrating sphere light source system 7, the three-dimensional adjustment platform 5 on the upper part of the test dark box, the turntable mechanism 11, the turntable stopper 10, and the wide-range illuminance variable light source 12. The integrating sphere system 7 is provided with an integrating sphere and an integrating sphere support device 8. The test device dark box 1 is the base of the entire test device, which carries various parts of the test device, and at the same time provides a completely black environment for the uniform integrating sphere light source system 7 of the image intensifier. The bottom surface of the test dark box 1 is provided with light exit holes and shaft through holes. And the limit h...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com