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A Time Interval Constraint Method for Controlling Machine Automatic Test Machine

A time interval, machine automation technology, applied in the direction of comprehensive factory control, electrical program control, comprehensive factory control, etc., can solve the problem of prolonged machine idle time, affecting product production cycle time, and inflexible machine automatic testing time Adjustment and other issues to achieve the effect of reducing product cycle, improving production efficiency and product yield

Active Publication Date: 2018-10-19
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a time interval constraint method for controlling the automatic test machine of a machine, which is used to solve the problem that the automatic test machine time of the machine in the prior art cannot be flexibly adjusted, resulting in machine The idle time of the station is prolonged, which affects the production cycle time of the product

Method used

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  • A Time Interval Constraint Method for Controlling Machine Automatic Test Machine
  • A Time Interval Constraint Method for Controlling Machine Automatic Test Machine
  • A Time Interval Constraint Method for Controlling Machine Automatic Test Machine

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Embodiment Construction

[0033] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0034] see Figure 1 to Figure 5 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arb...

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Abstract

The invention provides a time interval constraint method for controlling automatic machine measurement of a machine bench. The method includes following steps: the machine bench in need of automatic machine measurement is provided with a corresponding idle time constrained condition in a manufacture execution system; when a batch of cargos arrive at the machine bench, a machine bench automation system sends a constraint determination request to the manufacture execution system; the manufacture execution system determines whether the machine bench is constrained according to the set constrained condition and returns a determination result to the machine bench automation system; and the machine bench automation system controls whether automatic machine measurement is performed on the machine bench according to the determination result. The method can be flexibly applied to all process machine benches in a production line, the management and control of automatic measurement of the process machine benches can be realized, the idle time of the machine bench can be constrained, the constraint time can be delayed according to the scheduling of the production line, the product period is reduced, and the production efficiency and the product yield rate are increased.

Description

technical field [0001] The invention belongs to the field of semiconductor manufacturing, and relates to a time interval constraint method for controlling an automatic machine tester. Background technique [0002] In the process of using the product program, the user can only use the matching Monitor recipe (testing machine program) for machine measurement. And when the interval between the last use of the Monitor recipe and the current time exceeds a certain limit, it is not allowed to use the product program to continue the process on the machine. Therefore, each production machine needs to control the idle time of the machine Monitor recipe. This control mechanism used to be controlled manually, but now it is hoped to realize the control through the system. The engineer sets the idle time constraint conditions for each machine. When these conditions are met, it is hoped that the machine will not continue the process, but make corresponding measurements to check whether t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/418
CPCY02P90/02
Inventor 王蕊隋云飞王伦国苏远铁
Owner SEMICON MFG INT (SHANGHAI) CORP
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