The invention relates to the technical field of medical instrument
quality management, in particular to a medical instrument monitoring method and
system, and the method comprises the steps: firstly generating design
gene data containing a model code, a physical unclonable
fingerprint and a
quantum public key at a design freezing node, and writing the design
gene data into a Twindow-
DNA chip; in the manufacturing stage, process parameters and scattering optical data are synchronously collected, an optical domain super-vector is constructed and spliced with process embedding to form manufacturing embedding characteristic data, and the manufacturing embedding characteristic data are encrypted and then sent to a digital twinborn body; performing twin calculation on a normalized residual error, generating a residual error vector through vector holographic
convolution and multi-stage
diffusion denoising when the normalized residual error exceeds a threshold value, inputting the residual error vector into a super-vector converter to obtain defect semantic data, and writing the defect semantic data into a three-division
hypergraph account book which takes a
quantum public key as an index by using zero knowledge commitment; and calling the
hypergraph neural network and the neural relationship
inference model according to a
fixed time interval, outputting correction-prevention data, writing the correction-prevention data back to a
manufacturing execution system, and meanwhile, performing
hash chain writing on the correction-prevention data to form a quality
closed loop and support operation decision and regulation delivery.