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A test error correction method caused by the installation accuracy of planar near-field probes

A near-field probe and installation accuracy technology, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of difficult adjustment, difficult verticality adjustment, etc., and achieve the effect of simple and convenient engineering application and long adjustment time.

Active Publication Date: 2018-10-09
XIAN INSTITUE OF SPACE RADIO TECH
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Problems solved by technology

The verticality of the probe is generally calibrated after the processing of the probe is completed. Since the probe is a metal rectangular cavity structure, there are certain requirements for the flatness of the inner surface of the rectangle. It is difficult to adjust the verticality with high precision after processing. When installing, use very thin shims to adjust the overall inclination according to the direction of inclination, which is very difficult to adjust

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  • A test error correction method caused by the installation accuracy of planar near-field probes
  • A test error correction method caused by the installation accuracy of planar near-field probes
  • A test error correction method caused by the installation accuracy of planar near-field probes

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[0026] Such as figure 1 , figure 2 As shown, the coordinate system OXYZ is established, the Z-axis direction is the rotation axis of the probe, and the positive direction of the Z-axis is the outward direction of the probe opening. A method for correcting test errors caused by the installation accuracy of a plane near-field probe includes the following steps:

[0027] (1) Install the antenna to be tested according to the conventional planar near-field test method, and calibrate the site;

[0028] (2) At the initial position of the probe, select a suitable scanning range, generally use a range with a cutoff level less than -35dB, and a suitable test distance, generally choose 3 to 10 wavelengths away from the test antenna face, and perform the first polarization component Data collection to obtain near-field data D 0 ;At this point the probe is at the 0 degree position;

[0029] (3) The probe is rotated 90 degrees clockwise (looking along the positive direction of the Z axi...

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Abstract

A method of correcting test error caused by planar near-field probe installation accuracy comprises the steps as follows: first, installing an antenna under test according to a planar near-field test method, and performing site calibration; second, setting a scanning range and a test distance at the initial position of a probe, collecting first polarization component data to get near-field data D0, rotating the probe 90 degrees to get near-field data D90, continuing rotating the probe 90 degrees to get near-field data D180, and continuing rotating the probe 90 degrees to get near-field data D270; and third, performing near-to-far field transformation and data correction to get final corrected pattern data of the antenna under test. Mechanical adjustment in probe installation is avoided. Measurement error caused by probe installation accuracy is corrected through a mathematical algorithm, and then, pattern test data after correction of probe installation accuracy is obtained. The mechanical precision requirement of planar near-field for probe installation is reduced greatly.

Description

technical field [0001] The invention relates to a plane near-field error correction method, in particular to a test error correction method caused by the installation accuracy of a plane near-field probe, and belongs to the technical field of antenna measurement. Background technique [0002] Planar near-field is one of the antenna test methods. Near-field measurement is a technique for measuring electromagnetic fields in the near-field of the target to be measured. An antenna with known radiation characteristics is used as a probe to scan a surface in the near-field area of ​​the target to be measured. Then through mathematical transformation, the far-field characteristics of the target to be measured are obtained. The planar near field means that the scanning area is a plane. The planar near field originated in the 1950s, and its excellent characteristics have been widely praised, and it has been greatly promoted in recent years. [0003] With the widespread use of nea...

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Application Information

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IPC IPC(8): G01R29/10G01R35/00
CPCG01R29/10G01R35/005
Inventor 张启涛赵兵刘灵鸽马玉丰焦婧李文龙王宇
Owner XIAN INSTITUE OF SPACE RADIO TECH
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