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Evaluation method for true count capability-of-process meeting Poisson distribution

A technology of process capability index and Poisson distribution, which is applied in calculation, data processing applications, instruments, etc., to achieve correct results

Inactive Publication Date: 2017-03-08
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The invention can guarantee the calculation accuracy, solve the problem of calculating the process capability index of this kind of counting value using the defect number as the process parameter, so that the manufacturing industry that uses the defect number to represent the process level can accurately and quantitatively reflect the process level through the process capability index high and low

Method used

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  • Evaluation method for true count capability-of-process meeting Poisson distribution
  • Evaluation method for true count capability-of-process meeting Poisson distribution
  • Evaluation method for true count capability-of-process meeting Poisson distribution

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Embodiment Construction

[0023] Attached below figure 1 , the specific steps of the method of the present invention are described in detail as follows.

[0024] Step 1, collect samples.

[0025] Continuously collect m batches of samples in the process where the number of defects represents the process level in the production process, measure the number of defects in each batch of samples, and record them in the table.

[0026] Calculate the average value of the number of defects in m batches of samples, and use the average value as an estimated value of the Poisson distribution parameter describing the number of defects in the process corresponding to the collection of m batches of samples.

[0027] The embodiments of the present invention take the production process of a certain rectangular steel plate production workshop as an example.

[0028] In the production process of a rectangular steel plate production workshop, the staff used equipment to continuously collect 25 batches of samples in the p...

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Abstract

The invention discloses an evaluation method for true count capability-of-process meeting Poisson distribution. The method comprises the specific steps of 1, collecting samples; 2, calculating a cumulative probability of the Poisson distribution; 3, calculating capability-of-process; 4, judging whether the true count capability-of-process meets the requirement or not; 5, continuing to perform production; and 6, checking reasons for process capability deficiency. The method has the advantages that a result is correct; the method is more suitable for actual production; a corresponding relationship between the obtained capability-of-process CPU and a corresponding process yield is completely same as a corresponding relationship between metric value capability-of-process and the corresponding process yield; the values of the process yields can be directly represented only by comparing the values of the capability-of-process of different processes; and the metric value and true count capability-of-process is subjected to unified quantification.

Description

technical field [0001] The invention belongs to the field of product manufacturing process control, and further relates to a process level evaluation method based on counting values ​​in the technical field of process capability evaluation. The present invention calculates the process capability index for the manufacturing process whose process level is characterized by the number of defects, so as to correctly evaluate the actual process level of this type of process, and then determine whether the process can continue to be produced and processed. For example, in the weaving process, the number of defects on a certain area of ​​cloth is used to represent the number of defects. The electroplating process needs to detect the number of spot defects in the surface coating of the plated parts. The printed circuit board (PCB) processing in the electronics industry needs to detect short spots on the PCB. The number of strips and even strips of defects. The data attributes of these...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06
CPCG06Q10/06393
Inventor 游海龙贾新章顾铠田文星张金力
Owner XIDIAN UNIV
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