Capacitance sensor-based strain test device of magnetic shape memory alloy

A capacitive sensor, memory alloy technology, applied in electromagnetic measurement devices, electric/magnetic solid deformation measurement, etc., can solve problems such as the influence of strong magnetic fields around magnetic memory alloys
CN106524895AActive Publication Date: 2017-03-22GUANGDONG UNIV OF TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
GUANGDONG UNIV OF TECH
Publication Date
2017-03-22

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Abstract

The present invention discloses a capacitance sensor-based strain test device of magnetic shape memory alloy. According to the device, micro-deformation such as magnetic-field-induced strain of the magnetic shape memory alloy is converted into the change of the area of the parallel polar plate of a parallel plate capacitor probe, and displacement amount is converted to change amount. With the device adopted, the technical problem that a strain existing test device is affected by the surrounding strong magnetic field of the magnetic shape memory alloy can be solved, and therefore, the detection accuracy of the strain test device of the invention can be improved. The capacitance sensor-based strain test device of the magnetic shape memory alloy of the invention includes a capacitance probe, a gear amplifying mechanism (10), an input mechanism (11) an output mechanism (9) and the like.
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Description

technical field

[0001] The invention relates to the technical field of electromechanical control, in particular to a strain testing device for a magnetically controlled shape memory alloy based on a capacitive sensor. Background technique

[0002] In the research process of magnetic shape memory alloys, it is necessary to measure the magnetic strain, but there is no dedicated magnetic strain tester at present. When the existing strain tester is used for testing, its accuracy will inevitably be affected by the strong magnetic field around the magnetic memory alloy, which brings great inconvenience to the research of the magnetic memory alloy material. Contents of the invention

[0003] The invention provides a strain testing device for magnetically controlled shape memory alloys based on capacitive sensors. By converting the small deformations such as the magnetically induced strain of the magnetically controlled memory alloys into changes in the area of ​​the parallel plat...

Claims

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