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Magnetoacoustic Array Guided Wave Scattering Imaging Method for Practical Complex Defects in Metal Plates

A complex defect and scattering imaging technology, applied in the analysis of solids using sonic/ultrasonic/infrasonic waves, material analysis using sonic/ultrasonic/infrasonic waves, and sound-generating equipment, etc. Achieve the effect of fast calculation speed, high imaging efficiency and accurate solution

Active Publication Date: 2019-03-01
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the guided wave encounters a strong scattering from the defect, the influence and effect of the scattering dominate, and the scattering effect will cause more artifacts in the defect image reconstructed by the traditional guided wave imaging method, resulting in a detection blind spot, which seriously It affects the defect location and imaging accuracy of metal material structural parts
In addition, the shape of the actual defect is very complex, and the scattering characteristics are various. It is almost impossible to find a unified model to describe the scattering process and extract the scattering characteristics.
The above problems are the bottlenecks restricting the development of electromagnetic ultrasonic guided wave detection technology and the quality of defect imaging

Method used

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  • Magnetoacoustic Array Guided Wave Scattering Imaging Method for Practical Complex Defects in Metal Plates
  • Magnetoacoustic Array Guided Wave Scattering Imaging Method for Practical Complex Defects in Metal Plates
  • Magnetoacoustic Array Guided Wave Scattering Imaging Method for Practical Complex Defects in Metal Plates

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Embodiment 1

[0072] In this embodiment, the magnetoacoustic array guided wave scattering imaging method for complex defects in metal plates includes the following steps:

[0073] Step 1: Use 4 (i.e. N=4) controllable emission direction EMATs as excitation transducers, use 20 (i.e. M=20) omnidirectional receiving EMATs as receiving transducers, and arrange them evenly in a circular array Around the detection area of ​​the steel plate to be tested, the number of omnidirectional receiving EMATs between two adjacent controllable transmitting direction EMATs is 5. In addition, the thickness of the steel plate is, for example, 4 mm, and the diameter of the circular magneto-acoustic array is, for example, 1 m. And set the emission angle range of the controllable emission direction EMAT to 80°, and the angle step to 8°.

[0074]Step 2: Select the nth controllable emission direction EMAT from the 4 controllable emission directions EMAT in step 1 as the excitation transducer T for this detection n...

Embodiment 2

[0096] In this embodiment, the magnetoacoustic array guided wave scattering imaging method for complex defects in metal plates includes the following steps:

[0097] Step A: Use 6 (i.e. N=6) controllable emission direction EMATs as excitation transducers, use 18 (i.e. M=18) omnidirectional receiving EMATs as receiving transducers, and arrange them evenly in a circular array Around the detection area of ​​the aluminum plate to be tested, the number of omnidirectional receiving EMATs between two adjacent controllable transmitting direction EMATs is 3. In addition, the thickness of the aluminum plate is, for example, 3 mm, and the diameter of the circular magneto-acoustic array is, for example, 0.8 m. The emission angle range of the controllable emission direction EMAT is set to be, for example, 90°, and the angle step is, for example, 10°.

[0098] Step B: Select the nth controllable emission direction EMAT as the excitation transducer T for this detection n , where n=1,2,3,4,...

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Abstract

The present invention proposes a magnetoacoustic array guide wave scattering imaging method for actual complex defects in metal plates, including: using controllable emission direction EMAT as the excitation transducer, using omnidirectional EMAT as the receiving transducer; each controllable emission direction EMAT The guided wave is excited according to the preset emission angle range and angle step, and the omnidirectional receiving EMAT receives the guided wave signal every time the guided wave is excited; the emission EMAT and the receiving EMAT that constitute the scattering group are screened out by using the guided wave signal travel time ; Solve the position of scattering points and direction of scattering edge according to the spacing of scattering groups, emission angle and travel time of guided wave signal; perform curve fitting on all the obtained scattering points according to their respective scattering edge directions to form a clear outline image of actual complex defects. The invention can perform high-precision imaging on the actual complex defects of the metal plate, accurately solve the position of the scattering point and the direction of the scattering edge, fast in operation speed, and have high imaging efficiency on the actual complex defects.

Description

technical field [0001] The invention relates to the technical field of non-destructive testing, in particular to a magnetoacoustic array guided wave scattering imaging method for complex defects in metal plates. Background technique [0002] In metal plate component inspection projects, most of them can only judge the presence or absence of defects and determine their positions. However, it is more important to obtain quantitative information such as the size and contour shape of defects. These quantitative information are important for evaluating the health status of metal plate structures, guiding An important basis for its repair and maintenance work. With the increasingly stringent requirements for the safety of metal plate components, the detection of metal plate components can no longer be satisfied with the conventional judgment of the presence or absence of defects and the acquisition of equivalent size of defects. The direction of visualization of defect detection ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N29/06
CPCG01N29/069G01N2291/0234G01N29/043G01N29/221G01N29/2412G01N2291/011G01N2291/0289G01N2291/106G01N2291/2634G10K11/352
Inventor 黄松岭赵伟张宇王珅
Owner TSINGHUA UNIV